Test procedure and test station for carrying out the test procedure
A test procedure or test station for testing products, especially products completed on an assembly line type production process, performing the following steps: First, testing a parameter of a product with a first testing device using a first input signal to produce a first test result. Second, tes...
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creator | VOGGENREITER OTTO WAGNER THOMAS MASSEUS LEON YAP MEE-MOI WOJTALLA PETER BREU JOHANN PIRKL LUDWIG JURI WALTER STEGERER FRANZ |
description | A test procedure or test station for testing products, especially products completed on an assembly line type production process, performing the following steps: First, testing a parameter of a product with a first testing device using a first input signal to produce a first test result. Second, testing the same parameter of the product with a second testing device using a second input signal that is independent of the first input signal to produce a second test result. Third, deriving a differential value from the test results obtained by the testing devices. Fourth, determining the conformance of the testing station from the differential value and outputting an error message when the differential value deviates from a predetermined range. Fifth, repeating above steps for at least one other parameter. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US6154712A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US6154712A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US6154712A3</originalsourceid><addsrcrecordid>eNrjZHAOSS0uUSgoyk9OTSktSlVIzEtRKAEJFZcklmTm5ymk5RcpJCcWFVVm5qUr5JeWKJRkpEJUwDXxMLCmJeYUp_JCaW4GeTfXEGcP3dSC_PjU4oLE5NS81JL40GAzQ1MTc0MjR2PCKgDJ4THu</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Test procedure and test station for carrying out the test procedure</title><source>esp@cenet</source><creator>VOGGENREITER; OTTO ; WAGNER; THOMAS ; MASSEUS; LEON ; YAP; MEE-MOI ; WOJTALLA; PETER ; BREU; JOHANN ; PIRKL; LUDWIG ; JURI; WALTER ; STEGERER; FRANZ</creator><creatorcontrib>VOGGENREITER; OTTO ; WAGNER; THOMAS ; MASSEUS; LEON ; YAP; MEE-MOI ; WOJTALLA; PETER ; BREU; JOHANN ; PIRKL; LUDWIG ; JURI; WALTER ; STEGERER; FRANZ</creatorcontrib><description>A test procedure or test station for testing products, especially products completed on an assembly line type production process, performing the following steps: First, testing a parameter of a product with a first testing device using a first input signal to produce a first test result. Second, testing the same parameter of the product with a second testing device using a second input signal that is independent of the first input signal to produce a second test result. Third, deriving a differential value from the test results obtained by the testing devices. Fourth, determining the conformance of the testing station from the differential value and outputting an error message when the differential value deviates from a predetermined range. Fifth, repeating above steps for at least one other parameter.</description><edition>7</edition><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2000</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20001128&DB=EPODOC&CC=US&NR=6154712A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20001128&DB=EPODOC&CC=US&NR=6154712A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>VOGGENREITER; OTTO</creatorcontrib><creatorcontrib>WAGNER; THOMAS</creatorcontrib><creatorcontrib>MASSEUS; LEON</creatorcontrib><creatorcontrib>YAP; MEE-MOI</creatorcontrib><creatorcontrib>WOJTALLA; PETER</creatorcontrib><creatorcontrib>BREU; JOHANN</creatorcontrib><creatorcontrib>PIRKL; LUDWIG</creatorcontrib><creatorcontrib>JURI; WALTER</creatorcontrib><creatorcontrib>STEGERER; FRANZ</creatorcontrib><title>Test procedure and test station for carrying out the test procedure</title><description>A test procedure or test station for testing products, especially products completed on an assembly line type production process, performing the following steps: First, testing a parameter of a product with a first testing device using a first input signal to produce a first test result. Second, testing the same parameter of the product with a second testing device using a second input signal that is independent of the first input signal to produce a second test result. Third, deriving a differential value from the test results obtained by the testing devices. Fourth, determining the conformance of the testing station from the differential value and outputting an error message when the differential value deviates from a predetermined range. Fifth, repeating above steps for at least one other parameter.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2000</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZHAOSS0uUSgoyk9OTSktSlVIzEtRKAEJFZcklmTm5ymk5RcpJCcWFVVm5qUr5JeWKJRkpEJUwDXxMLCmJeYUp_JCaW4GeTfXEGcP3dSC_PjU4oLE5NS81JL40GAzQ1MTc0MjR2PCKgDJ4THu</recordid><startdate>20001128</startdate><enddate>20001128</enddate><creator>VOGGENREITER; OTTO</creator><creator>WAGNER; THOMAS</creator><creator>MASSEUS; LEON</creator><creator>YAP; MEE-MOI</creator><creator>WOJTALLA; PETER</creator><creator>BREU; JOHANN</creator><creator>PIRKL; LUDWIG</creator><creator>JURI; WALTER</creator><creator>STEGERER; FRANZ</creator><scope>EVB</scope></search><sort><creationdate>20001128</creationdate><title>Test procedure and test station for carrying out the test procedure</title><author>VOGGENREITER; OTTO ; WAGNER; THOMAS ; MASSEUS; LEON ; YAP; MEE-MOI ; WOJTALLA; PETER ; BREU; JOHANN ; PIRKL; LUDWIG ; JURI; WALTER ; STEGERER; FRANZ</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US6154712A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2000</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>VOGGENREITER; OTTO</creatorcontrib><creatorcontrib>WAGNER; THOMAS</creatorcontrib><creatorcontrib>MASSEUS; LEON</creatorcontrib><creatorcontrib>YAP; MEE-MOI</creatorcontrib><creatorcontrib>WOJTALLA; PETER</creatorcontrib><creatorcontrib>BREU; JOHANN</creatorcontrib><creatorcontrib>PIRKL; LUDWIG</creatorcontrib><creatorcontrib>JURI; WALTER</creatorcontrib><creatorcontrib>STEGERER; FRANZ</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>VOGGENREITER; OTTO</au><au>WAGNER; THOMAS</au><au>MASSEUS; LEON</au><au>YAP; MEE-MOI</au><au>WOJTALLA; PETER</au><au>BREU; JOHANN</au><au>PIRKL; LUDWIG</au><au>JURI; WALTER</au><au>STEGERER; FRANZ</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Test procedure and test station for carrying out the test procedure</title><date>2000-11-28</date><risdate>2000</risdate><abstract>A test procedure or test station for testing products, especially products completed on an assembly line type production process, performing the following steps: First, testing a parameter of a product with a first testing device using a first input signal to produce a first test result. Second, testing the same parameter of the product with a second testing device using a second input signal that is independent of the first input signal to produce a second test result. Third, deriving a differential value from the test results obtained by the testing devices. Fourth, determining the conformance of the testing station from the differential value and outputting an error message when the differential value deviates from a predetermined range. Fifth, repeating above steps for at least one other parameter.</abstract><edition>7</edition><oa>free_for_read</oa></addata></record> |
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subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS SEMICONDUCTOR DEVICES TESTING |
title | Test procedure and test station for carrying out the test procedure |
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