Automated method of burn-in and endurance testing for embedded EEPROM

An on-chip processor is used as a controller for burn-in and endurance testing of embedded non-volatile memory. An automated test machine downloads a test program into the non-volatile memory. The downloaded program contains a test program to be run on the non-volatile memory. When the burn-in or en...

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Bibliographische Detailangaben

Hauptverfasser:	MCPARTLAND, RICHARD J, ARNOLD, ROBERT H, BELL, RICHARD D, KOHLER, ROSS A, WHEELER, PAUL K
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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