System for evaluating thin film coatings

A system for evaluating the reflectance of an object (e.g., a CRT) that is coated with an anti-reflective coating material is disclosed. The quality and/or uniformity of the coating is evaluated by a reflectometer. The reflectometer is positioned relative to the object by non-contact sensors. Reflec...

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Bibliographische Detailangaben
Hauptverfasser: MEREDITH, JR., WILLIAM A, GAMMANS, CHARLES C, POWERS, KIM D, CLAYTON, KELLY R, BJORNARD, ERIK J
Format: Patent
Sprache:eng
Schlagworte:
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