Real time observation serial scan test architecture

Logic circuitry in the form of an integrated circuit includes a number of scannable registers located at various locations of the logic circuitry to continuously sample signal states thereat. In response to signalling from a maintenance diagnostic processor the scannable registers can be commanded t...

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Bibliographische Detailangaben
Hauptverfasser:	LIPIANSKY, EDUARDO M, PLUM, MICHAEL A, YAMAMOTO, KO, KHAKBAZ, JAVAD, SPROUSE, JEFFERY A, GIBSON, WALTER E, MANELA, PHILIP R
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Logic circuitry in the form of an integrated circuit includes a number of scannable registers located at various locations of the logic circuitry to continuously sample signal states thereat. In response to signalling from a maintenance diagnostic processor the scannable registers can be commanded to freeze their content for extraction and observation to determining the operating condition of the logic circuitry.