Method of photolithographically defining three regions with one mask step and self aligned isolation structure formed thereby

The preferred embodiment of the present invention provides a method for defining three regions on a semiconductor substrate using a single masking step. The preferred embodiment uses a photoresist material having, simultaneously, both a positive tone and a negative tone response to exposure. This co...

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Bibliographische Detailangaben
Hauptverfasser: LEIDY, ROBERT K, MLYNKO, WALTER E, SENGLE, EDWARD W, BRUCE, JAMES A, HOLMES, STEVEN J
Format: Patent
Sprache:eng
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