Programming architecture for a programmable integrated circuit employing test antifuses and test transistors

A programmable integrated circuit (see FIG. 5) has a plurality of linearly extending wire segments with antifuses disposed between each wire segment and a plurality of linearly extending programming conductors that are perpendicular to the wire segments. A plurality of programming transistors are di...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	APLAND, JAMES M
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRONIC CIRCUITRY CONVERSION OR DISTRIBUTION OF ELECTRIC POWER ELECTRICITY EMERGENCY PROTECTIVE CIRCUIT ARRANGEMENTS GENERATION PULSE TECHNIQUE
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