Method and apparatus for testing the data output system of a memory system

A method and apparatus for testing or verifying proper operation of a data output system of a memory system are provided. A known data signal is applied to a bit line, independent of the memory cells of the memory system associated with the bit line. Expected outputs of the data output system are de...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SAITOH, TOSHIHARU
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!