Method and apparatus for automatically detecting patterns in digital point-ordered signals
The present invention is a method and system for detecting a physical feature of a test piece by detecting a pattern in a signal representing data from inspection of the test piece. The pattern is detected by automated additive decomposition of a digital point-ordered signal which represents the dat...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | BRUDNOY DAVID M |
description | The present invention is a method and system for detecting a physical feature of a test piece by detecting a pattern in a signal representing data from inspection of the test piece. The pattern is detected by automated additive decomposition of a digital point-ordered signal which represents the data. The present invention can properly handle a non-periodic signal. A physical parameter of the test piece is measured. A digital point-ordered signal representative of the measured physical parameter is generated. The digital point-ordered signal is decomposed into a baseline signal, a background noise signal, and a peaks/troughs signal. The peaks/troughs from the peaks/troughs signal are located and peaks/troughs information indicating the physical feature of the test piece is output. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US5825672A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US5825672A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US5825672A3</originalsourceid><addsrcrecordid>eNqFyjEOwjAMQNEsDAg4A75Al6ICK0IgFiZgYamsxA2Wgh0l7sDt6cDO8PWWP3fPK9lLA6BM5YwFbawwaAEcTd9o7DGlDwQy8sYSIaMZFanAAoEjGybIymKNlkCFAlSOgqku3WyYoNXPhVufT_fjpaGsPdWMnoSsf9y6fdttd-1h8__4ApS8OyA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Method and apparatus for automatically detecting patterns in digital point-ordered signals</title><source>esp@cenet</source><creator>BRUDNOY; DAVID M</creator><creatorcontrib>BRUDNOY; DAVID M</creatorcontrib><description>The present invention is a method and system for detecting a physical feature of a test piece by detecting a pattern in a signal representing data from inspection of the test piece. The pattern is detected by automated additive decomposition of a digital point-ordered signal which represents the data. The present invention can properly handle a non-periodic signal. A physical parameter of the test piece is measured. A digital point-ordered signal representative of the measured physical parameter is generated. The digital point-ordered signal is decomposed into a baseline signal, a background noise signal, and a peaks/troughs signal. The peaks/troughs from the peaks/troughs signal are located and peaks/troughs information indicating the physical feature of the test piece is output.</description><edition>6</edition><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DIAGNOSIS ; ELECTRIC DIGITAL DATA PROCESSING ; HUMAN NECESSITIES ; HYGIENE ; IDENTIFICATION ; MEDICAL OR VETERINARY SCIENCE ; PHYSICS ; SURGERY</subject><creationdate>1998</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19981020&DB=EPODOC&CC=US&NR=5825672A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25547,76298</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19981020&DB=EPODOC&CC=US&NR=5825672A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BRUDNOY; DAVID M</creatorcontrib><title>Method and apparatus for automatically detecting patterns in digital point-ordered signals</title><description>The present invention is a method and system for detecting a physical feature of a test piece by detecting a pattern in a signal representing data from inspection of the test piece. The pattern is detected by automated additive decomposition of a digital point-ordered signal which represents the data. The present invention can properly handle a non-periodic signal. A physical parameter of the test piece is measured. A digital point-ordered signal representative of the measured physical parameter is generated. The digital point-ordered signal is decomposed into a baseline signal, a background noise signal, and a peaks/troughs signal. The peaks/troughs from the peaks/troughs signal are located and peaks/troughs information indicating the physical feature of the test piece is output.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DIAGNOSIS</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>HUMAN NECESSITIES</subject><subject>HYGIENE</subject><subject>IDENTIFICATION</subject><subject>MEDICAL OR VETERINARY SCIENCE</subject><subject>PHYSICS</subject><subject>SURGERY</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1998</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqFyjEOwjAMQNEsDAg4A75Al6ICK0IgFiZgYamsxA2Wgh0l7sDt6cDO8PWWP3fPK9lLA6BM5YwFbawwaAEcTd9o7DGlDwQy8sYSIaMZFanAAoEjGybIymKNlkCFAlSOgqku3WyYoNXPhVufT_fjpaGsPdWMnoSsf9y6fdttd-1h8__4ApS8OyA</recordid><startdate>19981020</startdate><enddate>19981020</enddate><creator>BRUDNOY; DAVID M</creator><scope>EVB</scope></search><sort><creationdate>19981020</creationdate><title>Method and apparatus for automatically detecting patterns in digital point-ordered signals</title><author>BRUDNOY; DAVID M</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US5825672A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1998</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DIAGNOSIS</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>HUMAN NECESSITIES</topic><topic>HYGIENE</topic><topic>IDENTIFICATION</topic><topic>MEDICAL OR VETERINARY SCIENCE</topic><topic>PHYSICS</topic><topic>SURGERY</topic><toplevel>online_resources</toplevel><creatorcontrib>BRUDNOY; DAVID M</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BRUDNOY; DAVID M</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Method and apparatus for automatically detecting patterns in digital point-ordered signals</title><date>1998-10-20</date><risdate>1998</risdate><abstract>The present invention is a method and system for detecting a physical feature of a test piece by detecting a pattern in a signal representing data from inspection of the test piece. The pattern is detected by automated additive decomposition of a digital point-ordered signal which represents the data. The present invention can properly handle a non-periodic signal. A physical parameter of the test piece is measured. A digital point-ordered signal representative of the measured physical parameter is generated. The digital point-ordered signal is decomposed into a baseline signal, a background noise signal, and a peaks/troughs signal. The peaks/troughs from the peaks/troughs signal are located and peaks/troughs information indicating the physical feature of the test piece is output.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US5825672A |
source | esp@cenet |
subjects | CALCULATING COMPUTING COUNTING DIAGNOSIS ELECTRIC DIGITAL DATA PROCESSING HUMAN NECESSITIES HYGIENE IDENTIFICATION MEDICAL OR VETERINARY SCIENCE PHYSICS SURGERY |
title | Method and apparatus for automatically detecting patterns in digital point-ordered signals |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-16T17%3A38%3A40IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BRUDNOY;%20DAVID%20M&rft.date=1998-10-20&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS5825672A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |