Test board and process of testing wide word memory parts

Wide word memory parts (608) are tested in a design for test "DFT" mode at elevated temperatures. The parts are mounted on test boards (600) and only the set of data I/O leads 0-3 active in the "DFT" mode, which is less than the total number of data I/O leads 0-15, connect to sub...

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Hauptverfasser:	LIONG, CHEN TECK, GUAN, THIANG NAN, BAKAR, ABU, KIANG, GOH MENG, POH, LOOI CHOON
Format:	Patent
Sprache:	eng
Schlagworte:	INFORMATION STORAGE PHYSICS STATIC STORES
Online-Zugang:	Volltext bestellen
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