Test board and process of testing wide word memory parts

Test board and process of testing wide word memory parts

Wide word memory parts (608) are tested in a design for test "DFT" mode at elevated temperatures. The parts are mounted on test boards (600) and only the set of data I/O leads 0-3 active in the "DFT" mode, which is less than the total number of data I/O leads 0-15, connect to sub...

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Bibliographische Detailangaben
Hauptverfasser: LIONG, CHEN TECK, GUAN, THIANG NAN, BAKAR, ABU, KIANG, GOH MENG, POH, LOOI CHOON
Format: Patent
Sprache:eng
Schlagworte:
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PHYSICS
STATIC STORES
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Beschreibung
Zusammenfassung:Wide word memory parts (608) are tested in a design for test "DFT" mode at elevated temperatures. The parts are mounted on test boards (600) and only the set of data I/O leads 0-3 active in the "DFT" mode, which is less than the total number of data I/O leads 0-15, connect to substrate terminals (604) that connect to tester receivers. This provides for using existing test equipment with only a change in the test boards (600) while obtaining a higher efficiency in testing a larger number of memory parts than if all the data I/O leads were connected to the receivers.