Method for testing a ball grid array semiconductor device and a device for such testing

A ball grid array semiconductor device (30) includes a plurality of conductive balls (36) and a plurality of conductive castellations (18) around its periphery as redundant electrical connections to a semiconductor die (12). During testing of the device in a test socket (50), the conductive castella...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	PASTORE, JOHN R, NOMI, VICTOR K, WILSON, HOWARD P
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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