Apparatus and method for tomography of microscopic samples

A type of tomography is described, wherein occupancy of lattice sites in a microscopic sample of crystalline material is predicted. An electron beam is projected through the sample, at a specific angle, causing discernible spots in a detector, such as photographic film. Each spot corresponds to a ro...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	FISHBURN, PETER C, SHEPP, LAWRENCE ALLAN, VANDERBEI, ROBERT JOSEPH, SCHWANDER, PETER
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY
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