Sensing apparatus
An apparatus for determining various physical quantities such as temperature, pressure, stress, strain, distance and the like in a manner such that a change in the physical quantity of interest results in a measurable change in the frequency of oscillation of a signal generated within the apparatus.
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creator | SCHIER J. ALAN |
description | An apparatus for determining various physical quantities such as temperature, pressure, stress, strain, distance and the like in a manner such that a change in the physical quantity of interest results in a measurable change in the frequency of oscillation of a signal generated within the apparatus. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US5635919A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US5635919A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US5635919A3</originalsourceid><addsrcrecordid>eNrjZBAMTs0rzsxLV0gsKEgsSiwpLeZhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfGhwaZmxqaWhpaOxoRVAABt0x82</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Sensing apparatus</title><source>esp@cenet</source><creator>SCHIER; J. ALAN</creator><creatorcontrib>SCHIER; J. ALAN</creatorcontrib><description>An apparatus for determining various physical quantities such as temperature, pressure, stress, strain, distance and the like in a manner such that a change in the physical quantity of interest results in a measurable change in the frequency of oscillation of a signal generated within the apparatus.</description><edition>6</edition><language>eng</language><subject>ANALOGOUS ARRANGEMENTS USING OTHER WAVES ; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; CALCULATING ; COMPUTING ; COUNTING ; DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES ; ELECTRIC DIGITAL DATA PROCESSING ; LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; MEASURING QUANTITY OF HEAT ; MEASURING TEMPERATURE ; PHYSICS ; RADIO DIRECTION-FINDING ; RADIO NAVIGATION ; TARIFF METERING APPARATUS ; TESTING ; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><creationdate>1997</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19970603&DB=EPODOC&CC=US&NR=5635919A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19970603&DB=EPODOC&CC=US&NR=5635919A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SCHIER; J. ALAN</creatorcontrib><title>Sensing apparatus</title><description>An apparatus for determining various physical quantities such as temperature, pressure, stress, strain, distance and the like in a manner such that a change in the physical quantity of interest results in a measurable change in the frequency of oscillation of a signal generated within the apparatus.</description><subject>ANALOGOUS ARRANGEMENTS USING OTHER WAVES</subject><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>MEASURING QUANTITY OF HEAT</subject><subject>MEASURING TEMPERATURE</subject><subject>PHYSICS</subject><subject>RADIO DIRECTION-FINDING</subject><subject>RADIO NAVIGATION</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><subject>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1997</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBAMTs0rzsxLV0gsKEgsSiwpLeZhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfGhwaZmxqaWhpaOxoRVAABt0x82</recordid><startdate>19970603</startdate><enddate>19970603</enddate><creator>SCHIER; J. ALAN</creator><scope>EVB</scope></search><sort><creationdate>19970603</creationdate><title>Sensing apparatus</title><author>SCHIER; J. ALAN</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US5635919A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1997</creationdate><topic>ANALOGOUS ARRANGEMENTS USING OTHER WAVES</topic><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>MEASURING QUANTITY OF HEAT</topic><topic>MEASURING TEMPERATURE</topic><topic>PHYSICS</topic><topic>RADIO DIRECTION-FINDING</topic><topic>RADIO NAVIGATION</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><topic>THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>SCHIER; J. ALAN</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SCHIER; J. ALAN</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Sensing apparatus</title><date>1997-06-03</date><risdate>1997</risdate><abstract>An apparatus for determining various physical quantities such as temperature, pressure, stress, strain, distance and the like in a manner such that a change in the physical quantity of interest results in a measurable change in the frequency of oscillation of a signal generated within the apparatus.</abstract><edition>6</edition><oa>free_for_read</oa></addata></record> |
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language | eng |
recordid | cdi_epo_espacenet_US5635919A |
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subjects | ANALOGOUS ARRANGEMENTS USING OTHER WAVES ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS CALCULATING COMPUTING COUNTING DETERMINING DISTANCE OR VELOCITY BY USE OF RADIO WAVES ELECTRIC DIGITAL DATA PROCESSING LOCATING OR PRESENCE-DETECTING BY USE OF THE REFLECTION ORRERADIATION OF RADIO WAVES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MEASURING QUANTITY OF HEAT MEASURING TEMPERATURE PHYSICS RADIO DIRECTION-FINDING RADIO NAVIGATION TARIFF METERING APPARATUS TESTING THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR |
title | Sensing apparatus |
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