Coaxial double-headed spring contact probe assembly

An electrical test probe assembly for loaded board testing includes a housing having a hollow interior, and first and second opposite shields positioned and axially slidable in the housing and outwardly biased against each other. The first and second opposite shields form first and second shield cav...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	BLACKARD, PAUL D, STOWERS, JEFFREY P, BURGERS, HENRI T
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS CURRENT COLLECTORS ELECTRICITY LINE CONNECTORS MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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