Method and apparatus for testing integrated circuit chips

A method and apparatus for testing semi-conductor chips is disclosed. The individual semiconductor chips have I/O contacts. The apparatus is provided with an interposer that has contacts corresponding to the contacts on the semiconductor chip. Both the chip and the interposer contacts can be any kno...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MARKOVICH, VOYA R, CORREIA, GEORGE C, PIERSON, MARK V, HORSFORD, KIBBY B, INGRAHAM, ANTHONY P, OSBORNE, JR., GORDON C, COUTURE, MARK A, HILL, GARY R, LOWELL, MICHAEL D, CHARLTON, RICHARD G
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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