Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts

A two-sided probe and clamshell fixture embodiment of the present invention comprises a vacuum-actuated bed-of-nails for probing the bottom side of a printed circuit board (PCB) device-under-test (DUT) and a pushrod-actuated bed-of-nails for probing the top side of the printed circuit board device-u...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SMITH, JEFFREY L, WEXLER, DONALD J
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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