Nonvolatile memory array wordline driver circuit with voltage translator circuit

A circuit for driving a wordline or group of wordlines in a floating-gate type EEPROM cell array includes a read-driver subcircuit for switching positive read voltages, a program-driver subcircuit for switching positive programming voltages and, optionally, a subcircuit for switching negative erasing voltages. The read-driver subcircuit may be constructed using relatively short-channel transistors for relatively high speed operation when connected to high-capacitance wordlines. On the other hand, the program-driver subcircuit may be constructed using relatively long-channel transistors and those long-channel transistors may be located on the memory chip remotely from the memory cells and from the read-driver circuit. P channel isolating transistors are used to isolate unused circuitry during operation. A voltage translator in the program-driver subcircuit has a transistor configuration that lessens the probability that the breakdown voltages of those transistors will be exceeded. A method for programming nonvolatile memory cell arrays is also disclosed.