EVALUATING CIRCUIT FOR INDUCTIVE DISPLACEMENT PICKUP
An evaluating circuit for an inductive pickup has a rectangular signal generator for outputing a rectangular signal, a driver stage for supplying a displaement pickup with an input signal produced from the rectangular signal, a phase-coupled rectifier operative for rectifying an output signal of the...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | ZIEHER PETER |
| description | An evaluating circuit for an inductive pickup has a rectangular signal generator for outputing a rectangular signal, a driver stage for supplying a displaement pickup with an input signal produced from the rectangular signal, a phase-coupled rectifier operative for rectifying an output signal of the displacement pickup with consideration of a phase of the rectangular signal, a sweeping/holding circuit for sweeping the rectified output signal in established sweeping time intervals, and a pulse supplying circuit which at predetermined time points produced on flanks of the rectangular signal control pulses for establishing the sweeping time intervals. The predetermined time points are selected so that during the sweeping time intervals established by the time points the output signal after introducing of rectangular pulse in the displacement pickup is substantially naturally oscillated. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US5175541A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US5175541A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US5175541A3</originalsourceid><addsrcrecordid>eNrjZDBxDXP0CXUM8fRzV3D2DHIO9QxRcPMPUvD0cwl1DvEMc1Vw8QwO8HF0dvV19QtRCPB09g4N4GFgTUvMKU7lhdLcDPJuriHOHrqpBfnxqcUFicmpeakl8aHBpobmpqYmho7GhFUAAEzoJvc</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>EVALUATING CIRCUIT FOR INDUCTIVE DISPLACEMENT PICKUP</title><source>esp@cenet</source><creator>ZIEHER; PETER</creator><creatorcontrib>ZIEHER; PETER</creatorcontrib><description>An evaluating circuit for an inductive pickup has a rectangular signal generator for outputing a rectangular signal, a driver stage for supplying a displaement pickup with an input signal produced from the rectangular signal, a phase-coupled rectifier operative for rectifying an output signal of the displacement pickup with consideration of a phase of the rectangular signal, a sweeping/holding circuit for sweeping the rectified output signal in established sweeping time intervals, and a pulse supplying circuit which at predetermined time points produced on flanks of the rectangular signal control pulses for establishing the sweeping time intervals. The predetermined time points are selected so that during the sweeping time intervals established by the time points the output signal after introducing of rectangular pulse in the displacement pickup is substantially naturally oscillated.</description><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>1992</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19921229&DB=EPODOC&CC=US&NR=5175541A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19921229&DB=EPODOC&CC=US&NR=5175541A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>ZIEHER; PETER</creatorcontrib><title>EVALUATING CIRCUIT FOR INDUCTIVE DISPLACEMENT PICKUP</title><description>An evaluating circuit for an inductive pickup has a rectangular signal generator for outputing a rectangular signal, a driver stage for supplying a displaement pickup with an input signal produced from the rectangular signal, a phase-coupled rectifier operative for rectifying an output signal of the displacement pickup with consideration of a phase of the rectangular signal, a sweeping/holding circuit for sweeping the rectified output signal in established sweeping time intervals, and a pulse supplying circuit which at predetermined time points produced on flanks of the rectangular signal control pulses for establishing the sweeping time intervals. The predetermined time points are selected so that during the sweeping time intervals established by the time points the output signal after introducing of rectangular pulse in the displacement pickup is substantially naturally oscillated.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1992</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDBxDXP0CXUM8fRzV3D2DHIO9QxRcPMPUvD0cwl1DvEMc1Vw8QwO8HF0dvV19QtRCPB09g4N4GFgTUvMKU7lhdLcDPJuriHOHrqpBfnxqcUFicmpeakl8aHBpobmpqYmho7GhFUAAEzoJvc</recordid><startdate>19921229</startdate><enddate>19921229</enddate><creator>ZIEHER; PETER</creator><scope>EVB</scope></search><sort><creationdate>19921229</creationdate><title>EVALUATING CIRCUIT FOR INDUCTIVE DISPLACEMENT PICKUP</title><author>ZIEHER; PETER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US5175541A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1992</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>ZIEHER; PETER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>ZIEHER; PETER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>EVALUATING CIRCUIT FOR INDUCTIVE DISPLACEMENT PICKUP</title><date>1992-12-29</date><risdate>1992</risdate><abstract>An evaluating circuit for an inductive pickup has a rectangular signal generator for outputing a rectangular signal, a driver stage for supplying a displaement pickup with an input signal produced from the rectangular signal, a phase-coupled rectifier operative for rectifying an output signal of the displacement pickup with consideration of a phase of the rectangular signal, a sweeping/holding circuit for sweeping the rectified output signal in established sweeping time intervals, and a pulse supplying circuit which at predetermined time points produced on flanks of the rectangular signal control pulses for establishing the sweeping time intervals. The predetermined time points are selected so that during the sweeping time intervals established by the time points the output signal after introducing of rectangular pulse in the displacement pickup is substantially naturally oscillated.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_US5175541A |
| source | esp@cenet |
| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
| title | EVALUATING CIRCUIT FOR INDUCTIVE DISPLACEMENT PICKUP |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-08T17%3A49%3A16IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=ZIEHER;%20PETER&rft.date=1992-12-29&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS5175541A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |