Low temperature silicon nitride CVD process

Thermal CVD process for forming Si3N4-type films on substrates by reaction of gaseous NF3 with gaseous disilane at a temperature in the range of 250 DEG -500 DEG C., at pressures of 0.1-10 Torr. The mole ratio of NF3 to silane is in the range of 0.5-3.0 and the reaction zone is preferably isothermal...

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Bibliographische Detailangaben
Hauptverfasser: FOSTER, DERRICK W
Format: Patent
Sprache:eng
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