High-temperature resistant elongation measuring system formed of ceramic materials

High-temperature resistant elongation measuring system formed of ceramic materials

A device for measuring elongation of a structure includes mounts formed at least partially of electrically insulating ceramic material, the mounts having at least two points to be attached to a structure for shifting the mounts relative to each other upon elongation of the structure, and electricall...

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Hauptverfasser: SCHUMACHER, GUENTHER, SCHMIDT, RUDOLF, STAUSEBACH, DIETER, ZENTIS, ALFRED, KLAS, ERNST
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
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creator SCHUMACHER
GUENTHER
SCHMIDT
RUDOLF
STAUSEBACH
DIETER
ZENTIS
ALFRED
KLAS
ERNST
description A device for measuring elongation of a structure includes mounts formed at least partially of electrically insulating ceramic material, the mounts having at least two points to be attached to a structure for shifting the mounts relative to each other upon elongation of the structure, and electrically conducting parts disposed on the mounts having electrical properties being influenced by the shifting of the mounts, at least a portion of each of the electrically conducting parts being subjected to mechanical stresses, and at least the portions of the electrically conducting parts being formed of electrically conductive ceramic material.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title High-temperature resistant elongation measuring system formed of ceramic materials
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