High-temperature resistant elongation measuring system formed of ceramic materials

A device for measuring elongation of a structure includes mounts formed at least partially of electrically insulating ceramic material, the mounts having at least two points to be attached to a structure for shifting the mounts relative to each other upon elongation of the structure, and electricall...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser:	SCHUMACHER, GUENTHER, SCHMIDT, RUDOLF, STAUSEBACH, DIETER, ZENTIS, ALFRED, KLAS, ERNST
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS TESTING
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Beschreibung
Zusammenfassung:	A device for measuring elongation of a structure includes mounts formed at least partially of electrically insulating ceramic material, the mounts having at least two points to be attached to a structure for shifting the mounts relative to each other upon elongation of the structure, and electrically conducting parts disposed on the mounts having electrical properties being influenced by the shifting of the mounts, at least a portion of each of the electrically conducting parts being subjected to mechanical stresses, and at least the portions of the electrically conducting parts being formed of electrically conductive ceramic material.