I-V Curve tracer employing parametric sampling
An I-V curve tracer measures an I-V relationship of an electrical device during transient conditions. In operation, the curve tracer couples across the device a fixed-value inductive or capacitive load. While the current and voltage flowing through the device approach steady-state levels, the voltag...
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creator | COX, III CHARLES H WARNER THOMAS H |
description | An I-V curve tracer measures an I-V relationship of an electrical device during transient conditions. In operation, the curve tracer couples across the device a fixed-value inductive or capacitive load. While the current and voltage flowing through the device approach steady-state levels, the voltage and current are sampled and stored in a memory upon predetermined incremental changes in one parameter of the device such as voltage. A digital representation of one parameter, such as voltage, constitutes a memory address and another parameter, such as current, is stored at that address in the memory. A data processor subsequently retrieves the memory data and addresses to display or plot the I-V relationship of the device. This parametric sampling technique assures that the measurements are coincident in occurrence with the sweeping of the I-V curve and eliminates the need for complex control and timing circuits. |
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In operation, the curve tracer couples across the device a fixed-value inductive or capacitive load. While the current and voltage flowing through the device approach steady-state levels, the voltage and current are sampled and stored in a memory upon predetermined incremental changes in one parameter of the device such as voltage. A digital representation of one parameter, such as voltage, constitutes a memory address and another parameter, such as current, is stored at that address in the memory. A data processor subsequently retrieves the memory data and addresses to display or plot the I-V relationship of the device. This parametric sampling technique assures that the measurements are coincident in occurrence with the sweeping of the I-V curve and eliminates the need for complex control and timing circuits.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>1984</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19840626&DB=EPODOC&CC=US&NR=4456880A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19840626&DB=EPODOC&CC=US&NR=4456880A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>COX, III; CHARLES H</creatorcontrib><creatorcontrib>WARNER; THOMAS H</creatorcontrib><title>I-V Curve tracer employing parametric sampling</title><description>An I-V curve tracer measures an I-V relationship of an electrical device during transient conditions. In operation, the curve tracer couples across the device a fixed-value inductive or capacitive load. While the current and voltage flowing through the device approach steady-state levels, the voltage and current are sampled and stored in a memory upon predetermined incremental changes in one parameter of the device such as voltage. A digital representation of one parameter, such as voltage, constitutes a memory address and another parameter, such as current, is stored at that address in the memory. A data processor subsequently retrieves the memory data and addresses to display or plot the I-V relationship of the device. This parametric sampling technique assures that the measurements are coincident in occurrence with the sweeping of the I-V curve and eliminates the need for complex control and timing circuits.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1984</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNDz1A1TcC4tKktVKClKTE4tUkjNLcjJr8zMS1coSCxKzE0tKcpMVihOBIoCxXgYWNMSc4pTeaE0N4O8m2uIs4duakF-fGpxAdCEvNSS-NBgExNTMwsLA0djwioAOzspzg</recordid><startdate>19840626</startdate><enddate>19840626</enddate><creator>COX, III; CHARLES H</creator><creator>WARNER; THOMAS H</creator><scope>EVB</scope></search><sort><creationdate>19840626</creationdate><title>I-V Curve tracer employing parametric sampling</title><author>COX, III; CHARLES H ; WARNER; THOMAS H</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US4456880A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1984</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>COX, III; CHARLES H</creatorcontrib><creatorcontrib>WARNER; THOMAS H</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>COX, III; CHARLES H</au><au>WARNER; THOMAS H</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>I-V Curve tracer employing parametric sampling</title><date>1984-06-26</date><risdate>1984</risdate><abstract>An I-V curve tracer measures an I-V relationship of an electrical device during transient conditions. In operation, the curve tracer couples across the device a fixed-value inductive or capacitive load. While the current and voltage flowing through the device approach steady-state levels, the voltage and current are sampled and stored in a memory upon predetermined incremental changes in one parameter of the device such as voltage. A digital representation of one parameter, such as voltage, constitutes a memory address and another parameter, such as current, is stored at that address in the memory. A data processor subsequently retrieves the memory data and addresses to display or plot the I-V relationship of the device. This parametric sampling technique assures that the measurements are coincident in occurrence with the sweeping of the I-V curve and eliminates the need for complex control and timing circuits.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | I-V Curve tracer employing parametric sampling |
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