Programmable logic array with self correction of faults
An apparatus and a method to automatically locate defects and to automatically insert and personalize dummy lines in a PLA having latches controlling the cross points of the AND and OR array. Upon occurrence of an error in the PLA, a check signal is generated which interrupts normal operation of the...
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| creator | SCHUETT DIETER GOETZE VOLKMAR |
| description | An apparatus and a method to automatically locate defects and to automatically insert and personalize dummy lines in a PLA having latches controlling the cross points of the AND and OR array. Upon occurrence of an error in the PLA, a check signal is generated which interrupts normal operation of the PLA and which initiates a test procedure. The cross point latches are automatically loaded with test patterns and the output of the PLA is analyzed to locate the defective part, for example, a damaged cross point transistor, short circuited or open line. The dummy lines are repersonalized automatically to replace lines which are defective themselves or which are connected to defective crosspoints. |
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Upon occurrence of an error in the PLA, a check signal is generated which interrupts normal operation of the PLA and which initiates a test procedure. The cross point latches are automatically loaded with test patterns and the output of the PLA is analyzed to locate the defective part, for example, a damaged cross point transistor, short circuited or open line. The dummy lines are repersonalized automatically to replace lines which are defective themselves or which are connected to defective crosspoints.</description><language>eng</language><subject>BASIC ELECTRONIC CIRCUITRY ; CALCULATING ; COMPUTING ; COUNTING ; ELECTRIC DIGITAL DATA PROCESSING ; ELECTRICITY ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; PULSE TECHNIQUE ; TESTING</subject><creationdate>1983</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19830419&DB=EPODOC&CC=US&NR=4380811A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19830419&DB=EPODOC&CC=US&NR=4380811A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SCHUETT; DIETER</creatorcontrib><creatorcontrib>GOETZE; VOLKMAR</creatorcontrib><title>Programmable logic array with self correction of faults</title><description>An apparatus and a method to automatically locate defects and to automatically insert and personalize dummy lines in a PLA having latches controlling the cross points of the AND and OR array. Upon occurrence of an error in the PLA, a check signal is generated which interrupts normal operation of the PLA and which initiates a test procedure. The cross point latches are automatically loaded with test patterns and the output of the PLA is analyzed to locate the defective part, for example, a damaged cross point transistor, short circuited or open line. The dummy lines are repersonalized automatically to replace lines which are defective themselves or which are connected to defective crosspoints.</description><subject>BASIC ELECTRONIC CIRCUITRY</subject><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>ELECTRIC DIGITAL DATA PROCESSING</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>PULSE TECHNIQUE</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1983</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDAPKMpPL0rMzU1MyklVyMlPz0xWSCwqSqxUKM8syVAoTs1JU0jOLypKTS7JzM9TyE9TSEsszSkp5mFgTUvMKU7lhdLcDPJuriHOHrqpBfnxqcUFicmpeakl8aHBJsYWBhaGho7GhFUAADWxLWI</recordid><startdate>19830419</startdate><enddate>19830419</enddate><creator>SCHUETT; DIETER</creator><creator>GOETZE; VOLKMAR</creator><scope>EVB</scope></search><sort><creationdate>19830419</creationdate><title>Programmable logic array with self correction of faults</title><author>SCHUETT; DIETER ; GOETZE; VOLKMAR</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US4380811A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1983</creationdate><topic>BASIC ELECTRONIC CIRCUITRY</topic><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>ELECTRIC DIGITAL DATA PROCESSING</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>PULSE TECHNIQUE</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SCHUETT; DIETER</creatorcontrib><creatorcontrib>GOETZE; VOLKMAR</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SCHUETT; DIETER</au><au>GOETZE; VOLKMAR</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Programmable logic array with self correction of faults</title><date>1983-04-19</date><risdate>1983</risdate><abstract>An apparatus and a method to automatically locate defects and to automatically insert and personalize dummy lines in a PLA having latches controlling the cross points of the AND and OR array. Upon occurrence of an error in the PLA, a check signal is generated which interrupts normal operation of the PLA and which initiates a test procedure. The cross point latches are automatically loaded with test patterns and the output of the PLA is analyzed to locate the defective part, for example, a damaged cross point transistor, short circuited or open line. The dummy lines are repersonalized automatically to replace lines which are defective themselves or which are connected to defective crosspoints.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRONIC CIRCUITRY CALCULATING COMPUTING COUNTING ELECTRIC DIGITAL DATA PROCESSING ELECTRICITY MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS PULSE TECHNIQUE TESTING |
| title | Programmable logic array with self correction of faults |
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