Chromatographic analyzer detector and method

An optical absorbance detector which can be used in process chromatographic analyzers is provided. Improvements are provided in noise reduction, temperature stability, operator convenience and construction. Noise reducing features include electrical signal filtering and optical system alignment. Tem...

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Hauptverfasser: KLEIN, FRED T, WALKER, STARNES E
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creator KLEIN
FRED T
WALKER
STARNES E
description An optical absorbance detector which can be used in process chromatographic analyzers is provided. Improvements are provided in noise reduction, temperature stability, operator convenience and construction. Noise reducing features include electrical signal filtering and optical system alignment. Temperature stability features include an electronic preamplifier inside the oven and a temperature controller to maintain an integrated circuit at a constant temperature. Operator conveniences include built-in calibration for electronic circuits and easy optical filter replacement. Construction features include explosion resistance and small size.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US4348115A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US4348115A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US4348115A3</originalsourceid><addsrcrecordid>eNrjZNBxzijKz00syU8vSizIyExWSMxLzKmsSi1SSEktSU0uyS8CiqQo5KaWZOSn8DCwpiXmFKfyQmluBnk31xBnD93Ugvz41OKCxOTUvNSS-NBgE2MTC0NDU0djwioAJDIpgA</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Chromatographic analyzer detector and method</title><source>esp@cenet</source><creator>KLEIN; FRED T ; WALKER; STARNES E</creator><creatorcontrib>KLEIN; FRED T ; WALKER; STARNES E</creatorcontrib><description>An optical absorbance detector which can be used in process chromatographic analyzers is provided. Improvements are provided in noise reduction, temperature stability, operator convenience and construction. Noise reducing features include electrical signal filtering and optical system alignment. Temperature stability features include an electronic preamplifier inside the oven and a temperature controller to maintain an integrated circuit at a constant temperature. Operator conveniences include built-in calibration for electronic circuits and easy optical filter replacement. Construction features include explosion resistance and small size.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>1982</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19820907&amp;DB=EPODOC&amp;CC=US&amp;NR=4348115A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19820907&amp;DB=EPODOC&amp;CC=US&amp;NR=4348115A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KLEIN; FRED T</creatorcontrib><creatorcontrib>WALKER; STARNES E</creatorcontrib><title>Chromatographic analyzer detector and method</title><description>An optical absorbance detector which can be used in process chromatographic analyzers is provided. Improvements are provided in noise reduction, temperature stability, operator convenience and construction. Noise reducing features include electrical signal filtering and optical system alignment. Temperature stability features include an electronic preamplifier inside the oven and a temperature controller to maintain an integrated circuit at a constant temperature. Operator conveniences include built-in calibration for electronic circuits and easy optical filter replacement. Construction features include explosion resistance and small size.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1982</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNBxzijKz00syU8vSizIyExWSMxLzKmsSi1SSEktSU0uyS8CiqQo5KaWZOSn8DCwpiXmFKfyQmluBnk31xBnD93Ugvz41OKCxOTUvNSS-NBgE2MTC0NDU0djwioAJDIpgA</recordid><startdate>19820907</startdate><enddate>19820907</enddate><creator>KLEIN; FRED T</creator><creator>WALKER; STARNES E</creator><scope>EVB</scope></search><sort><creationdate>19820907</creationdate><title>Chromatographic analyzer detector and method</title><author>KLEIN; FRED T ; WALKER; STARNES E</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US4348115A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1982</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>KLEIN; FRED T</creatorcontrib><creatorcontrib>WALKER; STARNES E</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KLEIN; FRED T</au><au>WALKER; STARNES E</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Chromatographic analyzer detector and method</title><date>1982-09-07</date><risdate>1982</risdate><abstract>An optical absorbance detector which can be used in process chromatographic analyzers is provided. Improvements are provided in noise reduction, temperature stability, operator convenience and construction. Noise reducing features include electrical signal filtering and optical system alignment. Temperature stability features include an electronic preamplifier inside the oven and a temperature controller to maintain an integrated circuit at a constant temperature. Operator conveniences include built-in calibration for electronic circuits and easy optical filter replacement. Construction features include explosion resistance and small size.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Chromatographic analyzer detector and method
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T20%3A17%3A56IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KLEIN;%20FRED%20T&rft.date=1982-09-07&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS4348115A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true