Backscatter instrument for measuring thickness of a continuously moving coated strip of substrate material
A backscatter measurement device for measuring the thickness of a coating on a strip of substrate material moving from a feed supply to a take up location at a predetermined speed. A measurement wheel is provided on the rim of which are mounted backscatter probes for irradiating and detecting the ba...
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| creator | LIEBER DEREK HAY WILLIAM DUNNING WEINSTOCK JACQUES |
| description | A backscatter measurement device for measuring the thickness of a coating on a strip of substrate material moving from a feed supply to a take up location at a predetermined speed. A measurement wheel is provided on the rim of which are mounted backscatter probes for irradiating and detecting the backscattered radiation from the coated substrate. The coated strip of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving strip whereby the probe and an adjacent point on the strip are stationary relative to one another while the point on the strip is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated strip. |
| format | Patent |
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A measurement wheel is provided on the rim of which are mounted backscatter probes for irradiating and detecting the backscattered radiation from the coated substrate. The coated strip of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving strip whereby the probe and an adjacent point on the strip are stationary relative to one another while the point on the strip is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated strip.</description><language>eng</language><subject>APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; SCANNING-PROBE TECHNIQUES OR APPARATUS ; TESTING</subject><creationdate>1978</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19780919&DB=EPODOC&CC=US&NR=4115690A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19780919&DB=EPODOC&CC=US&NR=4115690A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>LIEBER; DEREK</creatorcontrib><creatorcontrib>HAY; WILLIAM DUNNING</creatorcontrib><creatorcontrib>WEINSTOCK; JACQUES</creatorcontrib><title>Backscatter instrument for measuring thickness of a continuously moving coated strip of substrate material</title><description>A backscatter measurement device for measuring the thickness of a coating on a strip of substrate material moving from a feed supply to a take up location at a predetermined speed. A measurement wheel is provided on the rim of which are mounted backscatter probes for irradiating and detecting the backscattered radiation from the coated substrate. The coated strip of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving strip whereby the probe and an adjacent point on the strip are stationary relative to one another while the point on the strip is adjacent the rim. 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A measurement wheel is provided on the rim of which are mounted backscatter probes for irradiating and detecting the backscattered radiation from the coated substrate. The coated strip of substrate material is threaded around the outer surface of the rim. The measurement wheel is rotated at a speed such that the tangential speed of a point on the rim equals the speed of the moving strip whereby the probe and an adjacent point on the strip are stationary relative to one another while the point on the strip is adjacent the rim. Thus thickness measurements may be taken without stopping the movement of the coated strip.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING |
| title | Backscatter instrument for measuring thickness of a continuously moving coated strip of substrate material |
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