METHOD AND SYSTEM FOR CLEANING AN APERTURE IN A PARTICLE STUDY DEVICE

1521300 Analyzing particles electrically COULTER ELECTRONICS Ltd 28 Oct 1975 [4 Nov 1974] 44423/75 Heading G1N In order to remove debris clogging the aperture 14 of a particle detector pulses are applied to electrodes 16, 18, positioned on either side of the aperture from pulse generator 28. The ene...

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Hauptverfasser:	COULTER, WALLACE H
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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