PRODUCTION OF SiO{11 {11 TAPERED FILMS

During SiO2 etching, when the oxide surface etch rate is larger than the bulk etch rate and the photoresist adheres tenaciously to the surface, a near vertical wall or cusp will be formed. This will create potential fracture spots in sputtered or evaporated metal which covers the steps. In the fabri...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	MAC RAE A,US, MOLINE R,US
Format:	Patent
Sprache:	eng
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS SEMICONDUCTOR DEVICES TECHNICAL SUBJECTS COVERED BY FORMER USPC TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ARTCOLLECTIONS [XRACs] AND DIGESTS
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!