INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAKAGE SENSOR

INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAKAGE SENSOR

An integrated circuit (IC) comprising: a margin measurement circuit configured to monitor multiple data paths of the IC and to output, at different times, different ranges of remaining margins of the multiple data paths; a workload sensor configured to output a value representing aggregate operation...

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Hauptverfasser: LANDMAN, Evelyn, FAYNEH, Eyal, COHEN, Shai, WEINTROB, Inbar, DAVID, Yahel, REDLER, Guy
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator LANDMAN, Evelyn
FAYNEH, Eyal
COHEN, Shai
WEINTROB, Inbar
DAVID, Yahel
REDLER, Guy
description An integrated circuit (IC) comprising: a margin measurement circuit configured to monitor multiple data paths of the IC and to output, at different times, different ranges of remaining margins of the multiple data paths; a workload sensor configured to output a value representing aggregate operational stress experienced by the IC over a period of time ending at each of the different times; and a processor configured to: (i) compute, based on the value output by said workload sensor, an upper bound and a lower bound of change of the remaining margin of the IC, and (ii) compute upper and lower bounds of a current remaining margin of the IC, based on (a) the upper and lower bounds of change, and (b) a remaining margin indicated by a border between two adjacent ranges outputted by the margin measurement circuit.
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title INTEGRATED CIRCUIT WORKLOAD, TEMPERATURE, AND/OR SUB-THRESHOLD LEAKAGE SENSOR
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