METROLOGY SYSTEM CONFIGURED TO ILLUMINATE AND MEASURE APERTURES OF WORKPIECES

A metrology system includes front and back vision components portions, and is configured to have a workpiece positioned between the two portions. The back vision components portion includes a light source and a diffuser. The front vision components portion includes a variable focal length lens, an o...

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Bibliographische Detailangaben
Hauptverfasser:	HAMNER, Christopher Richard, NAGORNYKH, Pavel Ivanovich, GLADNICK, Paul Gerard
Format:	Patent
Sprache:	eng
Schlagworte:	CALCULATING COMPUTING COUNTING DEVICES OR ARRANGEMENTS, THE OPTICAL OPERATION OF WHICH ISMODIFIED BY CHANGING THE OPTICAL PROPERTIES OF THE MEDIUM OF THEDEVICES OR ARRANGEMENTS FOR THE CONTROL OF THE INTENSITY,COLOUR, PHASE, POLARISATION OR DIRECTION OF LIGHT, e.g.SWITCHING, GATING, MODULATING OR DEMODULATING ELECTRIC COMMUNICATION TECHNIQUE ELECTRICITY FREQUENCY-CHANGING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL MEASURING MEASURING ANGLES MEASURING AREAS MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS NON-LINEAR OPTICS OPTICAL ANALOGUE/DIGITAL CONVERTERS OPTICAL LOGIC ELEMENTS OPTICS PHYSICS PICTORIAL COMMUNICATION, e.g. TELEVISION TECHNIQUES OR PROCEDURES FOR THE OPERATION THEREOF TESTING
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