SEMICONDUCTOR MANUFACTURING APPARATUS

Provided is a semiconductor manufacturing apparatus that is capable of, while holding one surface of the wafer, grinding the holding surface of a wafer. A semiconductor manufacturing apparatus includes a first main surface holding unit that comes into contact with a center portion of a first main su...

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Hauptverfasser: YAMAMOTO, Shigehisa, AKAO, Shinya, KIMURA, Yasuhiro, OKI, Hirofumi
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Sprache:eng
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creator YAMAMOTO, Shigehisa
AKAO, Shinya
KIMURA, Yasuhiro
OKI, Hirofumi
description Provided is a semiconductor manufacturing apparatus that is capable of, while holding one surface of the wafer, grinding the holding surface of a wafer. A semiconductor manufacturing apparatus includes a first main surface holding unit that comes into contact with a center portion of a first main surface of a wafer in plan view and holds the wafer, and a first grinding unit that rotates about a rotation axis that overlaps a center of the wafer in plan view and extends in a direction perpendicular to the first main surface, and that grinds an outer periphery that is a region surrounding the center portion of the first main surface in contact with the outer periphery of the first main surface.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024387201A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024387201A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024387201A13</originalsourceid><addsrcrecordid>eNrjZFANdvX1dPb3cwl1DvEPUvB19At1c3QOCQ3y9HNXcAwIcAxyDAkN5mFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgZGJsYW5kYGho6GxsSpAgBcmiSe</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SEMICONDUCTOR MANUFACTURING APPARATUS</title><source>esp@cenet</source><creator>YAMAMOTO, Shigehisa ; AKAO, Shinya ; KIMURA, Yasuhiro ; OKI, Hirofumi</creator><creatorcontrib>YAMAMOTO, Shigehisa ; AKAO, Shinya ; KIMURA, Yasuhiro ; OKI, Hirofumi</creatorcontrib><description>Provided is a semiconductor manufacturing apparatus that is capable of, while holding one surface of the wafer, grinding the holding surface of a wafer. A semiconductor manufacturing apparatus includes a first main surface holding unit that comes into contact with a center portion of a first main surface of a wafer in plan view and holds the wafer, and a first grinding unit that rotates about a rotation axis that overlaps a center of the wafer in plan view and extends in a direction perpendicular to the first main surface, and that grinds an outer periphery that is a region surrounding the center portion of the first main surface in contact with the outer periphery of the first main surface.</description><language>eng</language><subject>BASIC ELECTRIC ELEMENTS ; DRESSING OR CONDITIONING OF ABRADING SURFACES ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS ; GRINDING ; MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING ; PERFORMING OPERATIONS ; POLISHING ; SEMICONDUCTOR DEVICES ; TRANSPORTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241121&amp;DB=EPODOC&amp;CC=US&amp;NR=2024387201A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241121&amp;DB=EPODOC&amp;CC=US&amp;NR=2024387201A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>YAMAMOTO, Shigehisa</creatorcontrib><creatorcontrib>AKAO, Shinya</creatorcontrib><creatorcontrib>KIMURA, Yasuhiro</creatorcontrib><creatorcontrib>OKI, Hirofumi</creatorcontrib><title>SEMICONDUCTOR MANUFACTURING APPARATUS</title><description>Provided is a semiconductor manufacturing apparatus that is capable of, while holding one surface of the wafer, grinding the holding surface of a wafer. A semiconductor manufacturing apparatus includes a first main surface holding unit that comes into contact with a center portion of a first main surface of a wafer in plan view and holds the wafer, and a first grinding unit that rotates about a rotation axis that overlaps a center of the wafer in plan view and extends in a direction perpendicular to the first main surface, and that grinds an outer periphery that is a region surrounding the center portion of the first main surface in contact with the outer periphery of the first main surface.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>DRESSING OR CONDITIONING OF ABRADING SURFACES</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</subject><subject>GRINDING</subject><subject>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</subject><subject>PERFORMING OPERATIONS</subject><subject>POLISHING</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFANdvX1dPb3cwl1DvEPUvB19At1c3QOCQ3y9HNXcAwIcAxyDAkN5mFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgZGJsYW5kYGho6GxsSpAgBcmiSe</recordid><startdate>20241121</startdate><enddate>20241121</enddate><creator>YAMAMOTO, Shigehisa</creator><creator>AKAO, Shinya</creator><creator>KIMURA, Yasuhiro</creator><creator>OKI, Hirofumi</creator><scope>EVB</scope></search><sort><creationdate>20241121</creationdate><title>SEMICONDUCTOR MANUFACTURING APPARATUS</title><author>YAMAMOTO, Shigehisa ; AKAO, Shinya ; KIMURA, Yasuhiro ; OKI, Hirofumi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024387201A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>DRESSING OR CONDITIONING OF ABRADING SURFACES</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</topic><topic>GRINDING</topic><topic>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</topic><topic>PERFORMING OPERATIONS</topic><topic>POLISHING</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>YAMAMOTO, Shigehisa</creatorcontrib><creatorcontrib>AKAO, Shinya</creatorcontrib><creatorcontrib>KIMURA, Yasuhiro</creatorcontrib><creatorcontrib>OKI, Hirofumi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>YAMAMOTO, Shigehisa</au><au>AKAO, Shinya</au><au>KIMURA, Yasuhiro</au><au>OKI, Hirofumi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SEMICONDUCTOR MANUFACTURING APPARATUS</title><date>2024-11-21</date><risdate>2024</risdate><abstract>Provided is a semiconductor manufacturing apparatus that is capable of, while holding one surface of the wafer, grinding the holding surface of a wafer. A semiconductor manufacturing apparatus includes a first main surface holding unit that comes into contact with a center portion of a first main surface of a wafer in plan view and holds the wafer, and a first grinding unit that rotates about a rotation axis that overlaps a center of the wafer in plan view and extends in a direction perpendicular to the first main surface, and that grinds an outer periphery that is a region surrounding the center portion of the first main surface in contact with the outer periphery of the first main surface.</abstract><oa>free_for_read</oa></addata></record>
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recordid cdi_epo_espacenet_US2024387201A1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
DRESSING OR CONDITIONING OF ABRADING SURFACES
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
GRINDING
MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING
PERFORMING OPERATIONS
POLISHING
SEMICONDUCTOR DEVICES
TRANSPORTING
title SEMICONDUCTOR MANUFACTURING APPARATUS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-29T15%3A49%3A44IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=YAMAMOTO,%20Shigehisa&rft.date=2024-11-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2024387201A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true