ACCELERATED DEGRADATION TESTING DEVICE

An accelerated degradation testing device is used for an accelerated degradation test in which degradation of a sample is accelerated by means of multiple degradation factors, and is provided with a hermetically sealed container capable of accommodating a sample as a target of the accelerated degrad...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: HASEGAWA, Yukinori, KITAMURA, Kenichi
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator HASEGAWA, Yukinori
KITAMURA, Kenichi
description An accelerated degradation testing device is used for an accelerated degradation test in which degradation of a sample is accelerated by means of multiple degradation factors, and is provided with a hermetically sealed container capable of accommodating a sample as a target of the accelerated degradation test, and a container holder for holding the hermetically sealed container. The accelerated degradation testing device is configured to conduct the accelerated degradation test of the sample accommodated in the hermetically sealed container in a state in which the sample is accommodated together with a liquid as one of degradation factors in the hermetically sealed container.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024385147A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024385147A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024385147A13</originalsourceid><addsrcrecordid>eNrjZFBzdHZ29XENcgxxdVFwcXUPcnRxDPH091MIcQ0O8fRzB4qFeTq78jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMjE2MLU0MTc0dDY-JUAQBEWiRm</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ACCELERATED DEGRADATION TESTING DEVICE</title><source>esp@cenet</source><creator>HASEGAWA, Yukinori ; KITAMURA, Kenichi</creator><creatorcontrib>HASEGAWA, Yukinori ; KITAMURA, Kenichi</creatorcontrib><description>An accelerated degradation testing device is used for an accelerated degradation test in which degradation of a sample is accelerated by means of multiple degradation factors, and is provided with a hermetically sealed container capable of accommodating a sample as a target of the accelerated degradation test, and a container holder for holding the hermetically sealed container. The accelerated degradation testing device is configured to conduct the accelerated degradation test of the sample accommodated in the hermetically sealed container in a state in which the sample is accommodated together with a liquid as one of degradation factors in the hermetically sealed container.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PERFORMING OPERATIONS ; PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL ; PHYSICS ; SEPARATION ; TESTING ; TRANSPORTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241121&amp;DB=EPODOC&amp;CC=US&amp;NR=2024385147A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241121&amp;DB=EPODOC&amp;CC=US&amp;NR=2024385147A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HASEGAWA, Yukinori</creatorcontrib><creatorcontrib>KITAMURA, Kenichi</creatorcontrib><title>ACCELERATED DEGRADATION TESTING DEVICE</title><description>An accelerated degradation testing device is used for an accelerated degradation test in which degradation of a sample is accelerated by means of multiple degradation factors, and is provided with a hermetically sealed container capable of accommodating a sample as a target of the accelerated degradation test, and a container holder for holding the hermetically sealed container. The accelerated degradation testing device is configured to conduct the accelerated degradation test of the sample accommodated in the hermetically sealed container in a state in which the sample is accommodated together with a liquid as one of degradation factors in the hermetically sealed container.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</subject><subject>PHYSICS</subject><subject>SEPARATION</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFBzdHZ29XENcgxxdVFwcXUPcnRxDPH091MIcQ0O8fRzB4qFeTq78jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMjE2MLU0MTc0dDY-JUAQBEWiRm</recordid><startdate>20241121</startdate><enddate>20241121</enddate><creator>HASEGAWA, Yukinori</creator><creator>KITAMURA, Kenichi</creator><scope>EVB</scope></search><sort><creationdate>20241121</creationdate><title>ACCELERATED DEGRADATION TESTING DEVICE</title><author>HASEGAWA, Yukinori ; KITAMURA, Kenichi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024385147A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</topic><topic>PHYSICS</topic><topic>SEPARATION</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HASEGAWA, Yukinori</creatorcontrib><creatorcontrib>KITAMURA, Kenichi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HASEGAWA, Yukinori</au><au>KITAMURA, Kenichi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ACCELERATED DEGRADATION TESTING DEVICE</title><date>2024-11-21</date><risdate>2024</risdate><abstract>An accelerated degradation testing device is used for an accelerated degradation test in which degradation of a sample is accelerated by means of multiple degradation factors, and is provided with a hermetically sealed container capable of accommodating a sample as a target of the accelerated degradation test, and a container holder for holding the hermetically sealed container. The accelerated degradation testing device is configured to conduct the accelerated degradation test of the sample accommodated in the hermetically sealed container in a state in which the sample is accommodated together with a liquid as one of degradation factors in the hermetically sealed container.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2024385147A1
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PERFORMING OPERATIONS
PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
PHYSICS
SEPARATION
TESTING
TRANSPORTING
title ACCELERATED DEGRADATION TESTING DEVICE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T13%3A17%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HASEGAWA,%20Yukinori&rft.date=2024-11-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2024385147A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true