ACCELERATED DEGRADATION TESTING DEVICE
An accelerated degradation testing device is used for an accelerated degradation test in which degradation of a sample is accelerated by means of multiple degradation factors, and is provided with a hermetically sealed container capable of accommodating a sample as a target of the accelerated degrad...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | HASEGAWA, Yukinori KITAMURA, Kenichi |
description | An accelerated degradation testing device is used for an accelerated degradation test in which degradation of a sample is accelerated by means of multiple degradation factors, and is provided with a hermetically sealed container capable of accommodating a sample as a target of the accelerated degradation test, and a container holder for holding the hermetically sealed container. The accelerated degradation testing device is configured to conduct the accelerated degradation test of the sample accommodated in the hermetically sealed container in a state in which the sample is accommodated together with a liquid as one of degradation factors in the hermetically sealed container. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024385147A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024385147A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024385147A13</originalsourceid><addsrcrecordid>eNrjZFBzdHZ29XENcgxxdVFwcXUPcnRxDPH091MIcQ0O8fRzB4qFeTq78jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMjE2MLU0MTc0dDY-JUAQBEWiRm</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ACCELERATED DEGRADATION TESTING DEVICE</title><source>esp@cenet</source><creator>HASEGAWA, Yukinori ; KITAMURA, Kenichi</creator><creatorcontrib>HASEGAWA, Yukinori ; KITAMURA, Kenichi</creatorcontrib><description>An accelerated degradation testing device is used for an accelerated degradation test in which degradation of a sample is accelerated by means of multiple degradation factors, and is provided with a hermetically sealed container capable of accommodating a sample as a target of the accelerated degradation test, and a container holder for holding the hermetically sealed container. The accelerated degradation testing device is configured to conduct the accelerated degradation test of the sample accommodated in the hermetically sealed container in a state in which the sample is accommodated together with a liquid as one of degradation factors in the hermetically sealed container.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PERFORMING OPERATIONS ; PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL ; PHYSICS ; SEPARATION ; TESTING ; TRANSPORTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241121&DB=EPODOC&CC=US&NR=2024385147A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241121&DB=EPODOC&CC=US&NR=2024385147A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HASEGAWA, Yukinori</creatorcontrib><creatorcontrib>KITAMURA, Kenichi</creatorcontrib><title>ACCELERATED DEGRADATION TESTING DEVICE</title><description>An accelerated degradation testing device is used for an accelerated degradation test in which degradation of a sample is accelerated by means of multiple degradation factors, and is provided with a hermetically sealed container capable of accommodating a sample as a target of the accelerated degradation test, and a container holder for holding the hermetically sealed container. The accelerated degradation testing device is configured to conduct the accelerated degradation test of the sample accommodated in the hermetically sealed container in a state in which the sample is accommodated together with a liquid as one of degradation factors in the hermetically sealed container.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</subject><subject>PHYSICS</subject><subject>SEPARATION</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFBzdHZ29XENcgxxdVFwcXUPcnRxDPH091MIcQ0O8fRzB4qFeTq78jCwpiXmFKfyQmluBmU31xBnD93Ugvz41OKCxOTUvNSS-NBgIwMjE2MLU0MTc0dDY-JUAQBEWiRm</recordid><startdate>20241121</startdate><enddate>20241121</enddate><creator>HASEGAWA, Yukinori</creator><creator>KITAMURA, Kenichi</creator><scope>EVB</scope></search><sort><creationdate>20241121</creationdate><title>ACCELERATED DEGRADATION TESTING DEVICE</title><author>HASEGAWA, Yukinori ; KITAMURA, Kenichi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024385147A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL</topic><topic>PHYSICS</topic><topic>SEPARATION</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HASEGAWA, Yukinori</creatorcontrib><creatorcontrib>KITAMURA, Kenichi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HASEGAWA, Yukinori</au><au>KITAMURA, Kenichi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ACCELERATED DEGRADATION TESTING DEVICE</title><date>2024-11-21</date><risdate>2024</risdate><abstract>An accelerated degradation testing device is used for an accelerated degradation test in which degradation of a sample is accelerated by means of multiple degradation factors, and is provided with a hermetically sealed container capable of accommodating a sample as a target of the accelerated degradation test, and a container holder for holding the hermetically sealed container. The accelerated degradation testing device is configured to conduct the accelerated degradation test of the sample accommodated in the hermetically sealed container in a state in which the sample is accommodated together with a liquid as one of degradation factors in the hermetically sealed container.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US2024385147A1 |
source | esp@cenet |
subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PERFORMING OPERATIONS PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL PHYSICS SEPARATION TESTING TRANSPORTING |
title | ACCELERATED DEGRADATION TESTING DEVICE |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-23T13%3A17%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HASEGAWA,%20Yukinori&rft.date=2024-11-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2024385147A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |