CORRECTING IMAGES CAPTURED WITH METALENSES USING DIFFERENT ILLUMINATION CHARACTERISTICS
An imaging system includes a controllable light source; an image sensor; metalens for focusing incoming light onto the image sensor; and processor(s). The processor(s) is configured to control a light source using a first illumination intensity and/or first illumination wavelength, while controlling...
Gespeichert in:
Hauptverfasser: | , |
---|---|
Format: | Patent |
Sprache: | eng |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | Strandborg, Mikko Ollila, Mikko |
description | An imaging system includes a controllable light source; an image sensor; metalens for focusing incoming light onto the image sensor; and processor(s). The processor(s) is configured to control a light source using a first illumination intensity and/or first illumination wavelength, while controlling the image sensor to capture first image; control the light source using a second illumination intensity and/or second illumination wavelength, while controlling the image sensor to capture a second image; calculate measured differences between pixel values of pixels in the first image and pixel values of corresponding pixels in the second image; estimate expected pixel value differences based on difference between the first and second illumination intensities and/or differences between the first and second illumination wavelengths; and correct pixel values of pixels in the first image and/or second image based on deviation in measured differences from expected differences. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024378848A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024378848A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024378848A13</originalsourceid><addsrcrecordid>eNqNyrEKwjAQgOEsDqK-Q8BZ0LZg1-N6bQ6SVJILHUuROIkW6vujgg_g9A__t1YD9iEQCvtOs4OOoka4SArU6IHFaEcClnz8jBS_quG2pUBeNFubHHsQ7r1GAwFQKHAUxrhVq9t0X_Lu143atyRoDnl-jnmZp2t-5NeYYnEsqvJc11UNp_I_9QbF_DKH</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>CORRECTING IMAGES CAPTURED WITH METALENSES USING DIFFERENT ILLUMINATION CHARACTERISTICS</title><source>esp@cenet</source><creator>Strandborg, Mikko ; Ollila, Mikko</creator><creatorcontrib>Strandborg, Mikko ; Ollila, Mikko</creatorcontrib><description>An imaging system includes a controllable light source; an image sensor; metalens for focusing incoming light onto the image sensor; and processor(s). The processor(s) is configured to control a light source using a first illumination intensity and/or first illumination wavelength, while controlling the image sensor to capture first image; control the light source using a second illumination intensity and/or second illumination wavelength, while controlling the image sensor to capture a second image; calculate measured differences between pixel values of pixels in the first image and pixel values of corresponding pixels in the second image; estimate expected pixel value differences based on difference between the first and second illumination intensities and/or differences between the first and second illumination wavelengths; and correct pixel values of pixels in the first image and/or second image based on deviation in measured differences from expected differences.</description><language>eng</language><subject>CALCULATING ; COMPUTING ; COUNTING ; IMAGE DATA PROCESSING OR GENERATION, IN GENERAL ; PHYSICS</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241114&DB=EPODOC&CC=US&NR=2024378848A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25544,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241114&DB=EPODOC&CC=US&NR=2024378848A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Strandborg, Mikko</creatorcontrib><creatorcontrib>Ollila, Mikko</creatorcontrib><title>CORRECTING IMAGES CAPTURED WITH METALENSES USING DIFFERENT ILLUMINATION CHARACTERISTICS</title><description>An imaging system includes a controllable light source; an image sensor; metalens for focusing incoming light onto the image sensor; and processor(s). The processor(s) is configured to control a light source using a first illumination intensity and/or first illumination wavelength, while controlling the image sensor to capture first image; control the light source using a second illumination intensity and/or second illumination wavelength, while controlling the image sensor to capture a second image; calculate measured differences between pixel values of pixels in the first image and pixel values of corresponding pixels in the second image; estimate expected pixel value differences based on difference between the first and second illumination intensities and/or differences between the first and second illumination wavelengths; and correct pixel values of pixels in the first image and/or second image based on deviation in measured differences from expected differences.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</subject><subject>PHYSICS</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyrEKwjAQgOEsDqK-Q8BZ0LZg1-N6bQ6SVJILHUuROIkW6vujgg_g9A__t1YD9iEQCvtOs4OOoka4SArU6IHFaEcClnz8jBS_quG2pUBeNFubHHsQ7r1GAwFQKHAUxrhVq9t0X_Lu143atyRoDnl-jnmZp2t-5NeYYnEsqvJc11UNp_I_9QbF_DKH</recordid><startdate>20241114</startdate><enddate>20241114</enddate><creator>Strandborg, Mikko</creator><creator>Ollila, Mikko</creator><scope>EVB</scope></search><sort><creationdate>20241114</creationdate><title>CORRECTING IMAGES CAPTURED WITH METALENSES USING DIFFERENT ILLUMINATION CHARACTERISTICS</title><author>Strandborg, Mikko ; Ollila, Mikko</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024378848A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>IMAGE DATA PROCESSING OR GENERATION, IN GENERAL</topic><topic>PHYSICS</topic><toplevel>online_resources</toplevel><creatorcontrib>Strandborg, Mikko</creatorcontrib><creatorcontrib>Ollila, Mikko</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Strandborg, Mikko</au><au>Ollila, Mikko</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>CORRECTING IMAGES CAPTURED WITH METALENSES USING DIFFERENT ILLUMINATION CHARACTERISTICS</title><date>2024-11-14</date><risdate>2024</risdate><abstract>An imaging system includes a controllable light source; an image sensor; metalens for focusing incoming light onto the image sensor; and processor(s). The processor(s) is configured to control a light source using a first illumination intensity and/or first illumination wavelength, while controlling the image sensor to capture first image; control the light source using a second illumination intensity and/or second illumination wavelength, while controlling the image sensor to capture a second image; calculate measured differences between pixel values of pixels in the first image and pixel values of corresponding pixels in the second image; estimate expected pixel value differences based on difference between the first and second illumination intensities and/or differences between the first and second illumination wavelengths; and correct pixel values of pixels in the first image and/or second image based on deviation in measured differences from expected differences.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng |
recordid | cdi_epo_espacenet_US2024378848A1 |
source | esp@cenet |
subjects | CALCULATING COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL PHYSICS |
title | CORRECTING IMAGES CAPTURED WITH METALENSES USING DIFFERENT ILLUMINATION CHARACTERISTICS |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T00%3A53%3A12IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Strandborg,%20Mikko&rft.date=2024-11-14&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2024378848A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |