CORRECTING IMAGES CAPTURED WITH METALENSES USING DIFFERENT ILLUMINATION CHARACTERISTICS

An imaging system includes a controllable light source; an image sensor; metalens for focusing incoming light onto the image sensor; and processor(s). The processor(s) is configured to control a light source using a first illumination intensity and/or first illumination wavelength, while controlling...

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Bibliographische Detailangaben
Hauptverfasser: Strandborg, Mikko, Ollila, Mikko
Format: Patent
Sprache:eng
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Beschreibung
Zusammenfassung:An imaging system includes a controllable light source; an image sensor; metalens for focusing incoming light onto the image sensor; and processor(s). The processor(s) is configured to control a light source using a first illumination intensity and/or first illumination wavelength, while controlling the image sensor to capture first image; control the light source using a second illumination intensity and/or second illumination wavelength, while controlling the image sensor to capture a second image; calculate measured differences between pixel values of pixels in the first image and pixel values of corresponding pixels in the second image; estimate expected pixel value differences based on difference between the first and second illumination intensities and/or differences between the first and second illumination wavelengths; and correct pixel values of pixels in the first image and/or second image based on deviation in measured differences from expected differences.