Protection Layer Formation during Plasma Etching Conductive Materials

A method of processing a substrate that includes: forming a patterned hardmask layer over a conductive layer to be etched, the conductive layer disposed over a substrate; and patterning the conductive layer using the patterned hardmask layer as an etch mask, by performing a cyclic plasma etch proces...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Joy, Nicholas, Lu, Yen-Tien, Chang, Shihsheng
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!