ISOLATED TEST AND MEASUREMENT PROBE
A test and measurement accessory has an input to receive an input signal from a device under test (DUT), a pilot signal generator to generate a pilot signal, an E/O converter to convert the input signal and the pilot signal to a combined optical signal, an O/E converter to convert the combined optic...
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creator | Bighouse, Roger D Knierim, Daniel G Brummer, Noah |
description | A test and measurement accessory has an input to receive an input signal from a device under test (DUT), a pilot signal generator to generate a pilot signal, an E/O converter to convert the input signal and the pilot signal to a combined optical signal, an O/E converter to convert the combined optical signal to a combined electrical signal, a signal separator to separate the pilot signal from the combined electrical signal, an amplitude detector to determine amplitude of the separated pilot signal, and circuitry to adjust a gain of a signal path using the amplitude. A test and measurement accessory has an input to receive an input signal from a DUT, an E/O converter to produce an optical signal, an optical splitter to split the optical signal into a feedback portion and a remaining portion, a feedback photodiode to produce a feedback electrical signal to adjust the optical signal. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024369665A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024369665A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024369665A13</originalsourceid><addsrcrecordid>eNrjZFD2DPb3cQxxdVEIcQ0OUXD0c1HwdXUMDg1y9XX1C1EICPJ3cuVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGRibGZpZmZqaOhsbEqQIA5g8jug</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ISOLATED TEST AND MEASUREMENT PROBE</title><source>esp@cenet</source><creator>Bighouse, Roger D ; Knierim, Daniel G ; Brummer, Noah</creator><creatorcontrib>Bighouse, Roger D ; Knierim, Daniel G ; Brummer, Noah</creatorcontrib><description>A test and measurement accessory has an input to receive an input signal from a device under test (DUT), a pilot signal generator to generate a pilot signal, an E/O converter to convert the input signal and the pilot signal to a combined optical signal, an O/E converter to convert the combined optical signal to a combined electrical signal, a signal separator to separate the pilot signal from the combined electrical signal, an amplitude detector to determine amplitude of the separated pilot signal, and circuitry to adjust a gain of a signal path using the amplitude. A test and measurement accessory has an input to receive an input signal from a DUT, an E/O converter to produce an optical signal, an optical splitter to split the optical signal into a feedback portion and a remaining portion, a feedback photodiode to produce a feedback electrical signal to adjust the optical signal.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241107&DB=EPODOC&CC=US&NR=2024369665A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241107&DB=EPODOC&CC=US&NR=2024369665A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Bighouse, Roger D</creatorcontrib><creatorcontrib>Knierim, Daniel G</creatorcontrib><creatorcontrib>Brummer, Noah</creatorcontrib><title>ISOLATED TEST AND MEASUREMENT PROBE</title><description>A test and measurement accessory has an input to receive an input signal from a device under test (DUT), a pilot signal generator to generate a pilot signal, an E/O converter to convert the input signal and the pilot signal to a combined optical signal, an O/E converter to convert the combined optical signal to a combined electrical signal, a signal separator to separate the pilot signal from the combined electrical signal, an amplitude detector to determine amplitude of the separated pilot signal, and circuitry to adjust a gain of a signal path using the amplitude. A test and measurement accessory has an input to receive an input signal from a DUT, an E/O converter to produce an optical signal, an optical splitter to split the optical signal into a feedback portion and a remaining portion, a feedback photodiode to produce a feedback electrical signal to adjust the optical signal.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD2DPb3cQxxdVEIcQ0OUXD0c1HwdXUMDg1y9XX1C1EICPJ3cuVhYE1LzClO5YXS3AzKbq4hzh66qQX58anFBYnJqXmpJfGhwUYGRibGZpZmZqaOhsbEqQIA5g8jug</recordid><startdate>20241107</startdate><enddate>20241107</enddate><creator>Bighouse, Roger D</creator><creator>Knierim, Daniel G</creator><creator>Brummer, Noah</creator><scope>EVB</scope></search><sort><creationdate>20241107</creationdate><title>ISOLATED TEST AND MEASUREMENT PROBE</title><author>Bighouse, Roger D ; Knierim, Daniel G ; Brummer, Noah</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024369665A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Bighouse, Roger D</creatorcontrib><creatorcontrib>Knierim, Daniel G</creatorcontrib><creatorcontrib>Brummer, Noah</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Bighouse, Roger D</au><au>Knierim, Daniel G</au><au>Brummer, Noah</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ISOLATED TEST AND MEASUREMENT PROBE</title><date>2024-11-07</date><risdate>2024</risdate><abstract>A test and measurement accessory has an input to receive an input signal from a device under test (DUT), a pilot signal generator to generate a pilot signal, an E/O converter to convert the input signal and the pilot signal to a combined optical signal, an O/E converter to convert the combined optical signal to a combined electrical signal, a signal separator to separate the pilot signal from the combined electrical signal, an amplitude detector to determine amplitude of the separated pilot signal, and circuitry to adjust a gain of a signal path using the amplitude. A test and measurement accessory has an input to receive an input signal from a DUT, an E/O converter to produce an optical signal, an optical splitter to split the optical signal into a feedback portion and a remaining portion, a feedback photodiode to produce a feedback electrical signal to adjust the optical signal.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | ISOLATED TEST AND MEASUREMENT PROBE |
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