SERIAL TEST CIRCUIT FOR CONTROLLABLE CHIPLETS
Disclosed is a serial test circuit for controllable Chiplets, which belongs to the technical field of test or measurement of semiconductor devices during manufacturing or processing. The test circuit includes a master control test module, a slave control test module, a clock controlling module and a...
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| creator | SONG, Jian WANG, Zixuan WANG, Yunbo WANG, Henglu ZHOU, Guopeng CAI, Zhikuang YAO, Jiafei GUO, Yufeng XU, Binbin |
| description | Disclosed is a serial test circuit for controllable Chiplets, which belongs to the technical field of test or measurement of semiconductor devices during manufacturing or processing. The test circuit includes a master control test module, a slave control test module, a clock controlling module and an outputting module. The master control test module is composed of a test access port module, a segment insertion bit module and a test data register module. The test controlling signal is generated by the master control test module, and the test inputting signals of the slave Chiplets are respectively controlled by the slave control test module after receiving the test controlling signal. At the same time, the test controlling signal is inputted to the clock controlling module to obtain the clock signals of the slave Chiplets. The output signal of the test outputting module is determined by the test controlling signal. |
| format | Patent |
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The output signal of the test outputting module is determined by the test controlling signal.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNANdg3ydPRRCHENDlFw9gxyDvUMUXDzD1Jw9vcLCfL38XF08nFVcPbwDPBxDQnmYWBNS8wpTuWF0twMym6uIc4euqkF-fGpxQWJyal5qSXxocFGBkYmxmaWZsaGjobGxKkCAF6pJoc</recordid><startdate>20241107</startdate><enddate>20241107</enddate><creator>SONG, Jian</creator><creator>WANG, Zixuan</creator><creator>WANG, Yunbo</creator><creator>WANG, Henglu</creator><creator>ZHOU, Guopeng</creator><creator>CAI, Zhikuang</creator><creator>YAO, Jiafei</creator><creator>GUO, Yufeng</creator><creator>XU, Binbin</creator><scope>EVB</scope></search><sort><creationdate>20241107</creationdate><title>SERIAL TEST CIRCUIT FOR CONTROLLABLE CHIPLETS</title><author>SONG, Jian ; WANG, Zixuan ; WANG, Yunbo ; WANG, Henglu ; ZHOU, Guopeng ; CAI, Zhikuang ; YAO, Jiafei ; GUO, Yufeng ; XU, Binbin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024369631A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SONG, Jian</creatorcontrib><creatorcontrib>WANG, Zixuan</creatorcontrib><creatorcontrib>WANG, Yunbo</creatorcontrib><creatorcontrib>WANG, Henglu</creatorcontrib><creatorcontrib>ZHOU, Guopeng</creatorcontrib><creatorcontrib>CAI, Zhikuang</creatorcontrib><creatorcontrib>YAO, Jiafei</creatorcontrib><creatorcontrib>GUO, Yufeng</creatorcontrib><creatorcontrib>XU, Binbin</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SONG, Jian</au><au>WANG, Zixuan</au><au>WANG, Yunbo</au><au>WANG, Henglu</au><au>ZHOU, Guopeng</au><au>CAI, Zhikuang</au><au>YAO, Jiafei</au><au>GUO, Yufeng</au><au>XU, Binbin</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SERIAL TEST CIRCUIT FOR CONTROLLABLE CHIPLETS</title><date>2024-11-07</date><risdate>2024</risdate><abstract>Disclosed is a serial test circuit for controllable Chiplets, which belongs to the technical field of test or measurement of semiconductor devices during manufacturing or processing. The test circuit includes a master control test module, a slave control test module, a clock controlling module and an outputting module. The master control test module is composed of a test access port module, a segment insertion bit module and a test data register module. The test controlling signal is generated by the master control test module, and the test inputting signals of the slave Chiplets are respectively controlled by the slave control test module after receiving the test controlling signal. At the same time, the test controlling signal is inputted to the clock controlling module to obtain the clock signals of the slave Chiplets. The output signal of the test outputting module is determined by the test controlling signal.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | SERIAL TEST CIRCUIT FOR CONTROLLABLE CHIPLETS |
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