INTEGRATED CIRCUIT WITH TIMING CORRECTION CIRCUITRY
A margin sensing circuit coupled to a flip flop of a critical data path includes a delay generator, a selector circuit which selects a delayed data output from the delay generator, a shadow latch corresponding to the flip flop, a comparator circuit which provides a match error indicator based on a c...
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creator | Gupta, Shilpa Tipple, David Russell Jarrar, Anis Mahmoud Bhooshan, Rishi Ahmadi Balef, Hadi |
description | A margin sensing circuit coupled to a flip flop of a critical data path includes a delay generator, a selector circuit which selects a delayed data output from the delay generator, a shadow latch corresponding to the flip flop, a comparator circuit which provides a match error indicator based on a comparison between a latched data output from the flip flop and a latched shadow output from the shadow latch, and an error latch to provide an error indicator based on the match error indicator. A correcting circuit includes a clock delay generator configured to receive a clock and provide a plurality of delayed clocks, and a clock selector circuit to select a delayed clock of the plurality of delayed clocks based on a set of clock select signals, in which each of the flip flop and the shadow latch are clocked by the selected delayed clock. |
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A correcting circuit includes a clock delay generator configured to receive a clock and provide a plurality of delayed clocks, and a clock selector circuit to select a delayed clock of the plurality of delayed clocks based on a set of clock select signals, in which each of the flip flop and the shadow latch are clocked by the selected delayed clock.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241017&DB=EPODOC&CC=US&NR=2024345163A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241017&DB=EPODOC&CC=US&NR=2024345163A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Gupta, Shilpa</creatorcontrib><creatorcontrib>Tipple, David Russell</creatorcontrib><creatorcontrib>Jarrar, Anis Mahmoud</creatorcontrib><creatorcontrib>Bhooshan, Rishi</creatorcontrib><creatorcontrib>Ahmadi Balef, Hadi</creatorcontrib><title>INTEGRATED CIRCUIT WITH TIMING CORRECTION CIRCUITRY</title><description>A margin sensing circuit coupled to a flip flop of a critical data path includes a delay generator, a selector circuit which selects a delayed data output from the delay generator, a shadow latch corresponding to the flip flop, a comparator circuit which provides a match error indicator based on a comparison between a latched data output from the flip flop and a latched shadow output from the shadow latch, and an error latch to provide an error indicator based on the match error indicator. A correcting circuit includes a clock delay generator configured to receive a clock and provide a plurality of delayed clocks, and a clock selector circuit to select a delayed clock of the plurality of delayed clocks based on a set of clock select signals, in which each of the flip flop and the shadow latch are clocked by the selected delayed clock.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD29AtxdQ9yDHF1UXD2DHIO9QxRCPcM8VAI8fT19HNXcPYPCnJ1DvH094NJB0XyMLCmJeYUp_JCaW4GZTfXEGcP3dSC_PjU4oLE5NS81JL40GAjAyMTYxNTQzNjR0Nj4lQBAGF0KF4</recordid><startdate>20241017</startdate><enddate>20241017</enddate><creator>Gupta, Shilpa</creator><creator>Tipple, David Russell</creator><creator>Jarrar, Anis Mahmoud</creator><creator>Bhooshan, Rishi</creator><creator>Ahmadi Balef, Hadi</creator><scope>EVB</scope></search><sort><creationdate>20241017</creationdate><title>INTEGRATED CIRCUIT WITH TIMING CORRECTION CIRCUITRY</title><author>Gupta, Shilpa ; Tipple, David Russell ; Jarrar, Anis Mahmoud ; Bhooshan, Rishi ; Ahmadi Balef, Hadi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024345163A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Gupta, Shilpa</creatorcontrib><creatorcontrib>Tipple, David Russell</creatorcontrib><creatorcontrib>Jarrar, Anis Mahmoud</creatorcontrib><creatorcontrib>Bhooshan, Rishi</creatorcontrib><creatorcontrib>Ahmadi Balef, Hadi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Gupta, Shilpa</au><au>Tipple, David Russell</au><au>Jarrar, Anis Mahmoud</au><au>Bhooshan, Rishi</au><au>Ahmadi Balef, Hadi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INTEGRATED CIRCUIT WITH TIMING CORRECTION CIRCUITRY</title><date>2024-10-17</date><risdate>2024</risdate><abstract>A margin sensing circuit coupled to a flip flop of a critical data path includes a delay generator, a selector circuit which selects a delayed data output from the delay generator, a shadow latch corresponding to the flip flop, a comparator circuit which provides a match error indicator based on a comparison between a latched data output from the flip flop and a latched shadow output from the shadow latch, and an error latch to provide an error indicator based on the match error indicator. A correcting circuit includes a clock delay generator configured to receive a clock and provide a plurality of delayed clocks, and a clock selector circuit to select a delayed clock of the plurality of delayed clocks based on a set of clock select signals, in which each of the flip flop and the shadow latch are clocked by the selected delayed clock.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
title | INTEGRATED CIRCUIT WITH TIMING CORRECTION CIRCUITRY |
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