ELECTRON BIAS CONTROL SIGNALS FOR ELECTRON ENHANCED MATERIAL PROCESSING

Systems and methods for material processing using wafer scale waves of precisely controlled electrons in a DC plasma is presented. A surface floating potential of a substrate placed atop a stage in a positive column of the DC plasma is adjusted and maintained to a reference potential. A periodic bia...

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Bibliographische Detailangaben
Hauptverfasser: Anz, Samir John, Sando, Stewart Francis, Goddard, William Andrew, Margolese, David Irwin
Format: Patent
Sprache:eng
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