PARTICLES FOR SPECIMEN EXAMINATIONS

Provided are a particle that enables a high-sensitivity specimen test by a fluorescence depolarization method, and a method of producing the same. Specifically, provided is a particle including a particle substrate, wherein the particle substrate includes: a polymer containing a styrene unit and an...

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Bibliographische Detailangaben
Hauptverfasser:	NAKAJIMA, IKUO, KANAZAKI, KENGO, NAKAMURA, TOMOHIRO, MASUMURA, TAKAHIRO, KAKEGAWA, NORISHIGE, YAMAUCHI, FUMIO, SAKAKIBARA, TEIGO
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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Beschreibung
Zusammenfassung:	Provided are a particle that enables a high-sensitivity specimen test by a fluorescence depolarization method, and a method of producing the same. Specifically, provided is a particle including a particle substrate, wherein the particle substrate includes: a polymer containing a styrene unit and an organic silane unit; and a europium complex, and wherein the particle substrate contains a siloxane bond on at least a surface of the particle substrate.