METHODS AND APPARATUS FOR PREPARING THIN-FILM SPECIMENS

Systems and methods are provided for enhanced thin-film specimen preparation solutions. A cutting device may be used in preparing thin-film specimens. The cutting device may have one or more cutting elements configured to apply uniform cuts into a thin-film specimen sheet as the cutting device is mo...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	Bowser, Jeffrey
Format:	Patent
Sprache:	eng
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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