METHODS AND APPARATUS FOR PREPARING THIN-FILM SPECIMENS

METHODS AND APPARATUS FOR PREPARING THIN-FILM SPECIMENS

Systems and methods are provided for enhanced thin-film specimen preparation solutions. A cutting device may be used in preparing thin-film specimens. The cutting device may have one or more cutting elements configured to apply uniform cuts into a thin-film specimen sheet as the cutting device is mo...

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1. Verfasser: Bowser, Jeffrey
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator Bowser, Jeffrey
description Systems and methods are provided for enhanced thin-film specimen preparation solutions. A cutting device may be used in preparing thin-film specimens. The cutting device may have one or more cutting elements configured to apply uniform cuts into a thin-film specimen sheet as the cutting device is moved over the thin-film specimen sheet. A cutting base may be used to maintain the thin-film specimen sheet in place as the cutting device is moved to apply the cuts. The cutting base may be configured for placement on top of the thin-film specimen sheet. The cutting base and the cutting device are integrated together, or may be separate components. The one or more cutting elements may be rotating blades. The one or more cutting elements may be evenly spaced
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title METHODS AND APPARATUS FOR PREPARING THIN-FILM SPECIMENS
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