Sample Analysis Device

Sample Analysis Device

Provided is a sample analysis device, including: a housing, a reagent preparation apparatus, a sample processing apparatus, and an analysis apparatus. A first independent space, a second independent space and a third independent space are sequentially arranged in the housing at intervals. The reagen...

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Hauptverfasser: HE, Guoyao, XIAO, Hao, YIN, Li, RAO, Jie, ZHENG, Xiaolin, ZHU, Liang, TANG, Junhui, WANG, Yixian
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator HE, Guoyao
XIAO, Hao
YIN, Li
RAO, Jie
ZHENG, Xiaolin
ZHU, Liang
TANG, Junhui
WANG, Yixian
description Provided is a sample analysis device, including: a housing, a reagent preparation apparatus, a sample processing apparatus, and an analysis apparatus. A first independent space, a second independent space and a third independent space are sequentially arranged in the housing at intervals. The reagent preparation apparatus is arranged in the first independent space. The sample processing apparatus is arranged in the second independent space, a first conveying channel is arranged between the reagent preparation apparatus and the sample processing apparatus, a first switching piece is arranged at the first conveying channel, and the first switching piece has a first opening state and a first closing state. The analysis apparatus is arranged in the third independent space, a second conveying channel is arranged between the analysis apparatus and the sample processing apparatus, a second switching piece is arranged at the second conveying channel, and the second switching piece has a second opening state and a second closing state.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024248107A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024248107A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024248107A13</originalsourceid><addsrcrecordid>eNrjZBALTswtyElVcMxLzKkszixWcEkty0xO5WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgZGJkYmFoYG5o6GxsSpAgAHUSIj</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Sample Analysis Device</title><source>esp@cenet</source><creator>HE, Guoyao ; XIAO, Hao ; YIN, Li ; RAO, Jie ; ZHENG, Xiaolin ; ZHU, Liang ; TANG, Junhui ; WANG, Yixian</creator><creatorcontrib>HE, Guoyao ; XIAO, Hao ; YIN, Li ; RAO, Jie ; ZHENG, Xiaolin ; ZHU, Liang ; TANG, Junhui ; WANG, Yixian</creatorcontrib><description>Provided is a sample analysis device, including: a housing, a reagent preparation apparatus, a sample processing apparatus, and an analysis apparatus. A first independent space, a second independent space and a third independent space are sequentially arranged in the housing at intervals. The reagent preparation apparatus is arranged in the first independent space. The sample processing apparatus is arranged in the second independent space, a first conveying channel is arranged between the reagent preparation apparatus and the sample processing apparatus, a first switching piece is arranged at the first conveying channel, and the first switching piece has a first opening state and a first closing state. The analysis apparatus is arranged in the third independent space, a second conveying channel is arranged between the analysis apparatus and the sample processing apparatus, a second switching piece is arranged at the second conveying channel, and the second switching piece has a second opening state and a second closing state.</description><language>eng</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240725&amp;DB=EPODOC&amp;CC=US&amp;NR=2024248107A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240725&amp;DB=EPODOC&amp;CC=US&amp;NR=2024248107A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HE, Guoyao</creatorcontrib><creatorcontrib>XIAO, Hao</creatorcontrib><creatorcontrib>YIN, Li</creatorcontrib><creatorcontrib>RAO, Jie</creatorcontrib><creatorcontrib>ZHENG, Xiaolin</creatorcontrib><creatorcontrib>ZHU, Liang</creatorcontrib><creatorcontrib>TANG, Junhui</creatorcontrib><creatorcontrib>WANG, Yixian</creatorcontrib><title>Sample Analysis Device</title><description>Provided is a sample analysis device, including: a housing, a reagent preparation apparatus, a sample processing apparatus, and an analysis apparatus. A first independent space, a second independent space and a third independent space are sequentially arranged in the housing at intervals. The reagent preparation apparatus is arranged in the first independent space. The sample processing apparatus is arranged in the second independent space, a first conveying channel is arranged between the reagent preparation apparatus and the sample processing apparatus, a first switching piece is arranged at the first conveying channel, and the first switching piece has a first opening state and a first closing state. The analysis apparatus is arranged in the third independent space, a second conveying channel is arranged between the analysis apparatus and the sample processing apparatus, a second switching piece is arranged at the second conveying channel, and the second switching piece has a second opening state and a second closing state.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBALTswtyElVcMxLzKkszixWcEkty0xO5WFgTUvMKU7lhdLcDMpuriHOHrqpBfnxqcUFicmpeakl8aHBRgZGJkYmFoYG5o6GxsSpAgAHUSIj</recordid><startdate>20240725</startdate><enddate>20240725</enddate><creator>HE, Guoyao</creator><creator>XIAO, Hao</creator><creator>YIN, Li</creator><creator>RAO, Jie</creator><creator>ZHENG, Xiaolin</creator><creator>ZHU, Liang</creator><creator>TANG, Junhui</creator><creator>WANG, Yixian</creator><scope>EVB</scope></search><sort><creationdate>20240725</creationdate><title>Sample Analysis Device</title><author>HE, Guoyao ; XIAO, Hao ; YIN, Li ; RAO, Jie ; ZHENG, Xiaolin ; ZHU, Liang ; TANG, Junhui ; WANG, Yixian</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024248107A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>HE, Guoyao</creatorcontrib><creatorcontrib>XIAO, Hao</creatorcontrib><creatorcontrib>YIN, Li</creatorcontrib><creatorcontrib>RAO, Jie</creatorcontrib><creatorcontrib>ZHENG, Xiaolin</creatorcontrib><creatorcontrib>ZHU, Liang</creatorcontrib><creatorcontrib>TANG, Junhui</creatorcontrib><creatorcontrib>WANG, Yixian</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HE, Guoyao</au><au>XIAO, Hao</au><au>YIN, Li</au><au>RAO, Jie</au><au>ZHENG, Xiaolin</au><au>ZHU, Liang</au><au>TANG, Junhui</au><au>WANG, Yixian</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Sample Analysis Device</title><date>2024-07-25</date><risdate>2024</risdate><abstract>Provided is a sample analysis device, including: a housing, a reagent preparation apparatus, a sample processing apparatus, and an analysis apparatus. A first independent space, a second independent space and a third independent space are sequentially arranged in the housing at intervals. The reagent preparation apparatus is arranged in the first independent space. The sample processing apparatus is arranged in the second independent space, a first conveying channel is arranged between the reagent preparation apparatus and the sample processing apparatus, a first switching piece is arranged at the first conveying channel, and the first switching piece has a first opening state and a first closing state. The analysis apparatus is arranged in the third independent space, a second conveying channel is arranged between the analysis apparatus and the sample processing apparatus, a second switching piece is arranged at the second conveying channel, and the second switching piece has a second opening state and a second closing state.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title Sample Analysis Device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-31T15%3A12%3A05IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HE,%20Guoyao&rft.date=2024-07-25&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2024248107A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true