INSPECTION DEVICE FOR OPTICAL SEMICONDUCTOR DEVICE

A plurality of electrodes (13) are provided on tip ends of a plurality of blocks (8) respectively. The plurality of lead terminals (3) are sandwiched by the plurality of blocks (8) and the plurality of wires (9) to correct positions of the plurality of lead terminals (3). The plurality of electrodes...

Ausführliche Beschreibung

Bibliographische Detailangaben

1. Verfasser:	TANIUCHI, Tomohito
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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