INSPECTION DEVICE FOR OPTICAL SEMICONDUCTOR DEVICE

INSPECTION DEVICE FOR OPTICAL SEMICONDUCTOR DEVICE

A plurality of electrodes (13) are provided on tip ends of a plurality of blocks (8) respectively. The plurality of lead terminals (3) are sandwiched by the plurality of blocks (8) and the plurality of wires (9) to correct positions of the plurality of lead terminals (3). The plurality of electrodes...

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1. Verfasser: TANIUCHI, Tomohito
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator TANIUCHI, Tomohito
description A plurality of electrodes (13) are provided on tip ends of a plurality of blocks (8) respectively. The plurality of lead terminals (3) are sandwiched by the plurality of blocks (8) and the plurality of wires (9) to correct positions of the plurality of lead terminals (3). The plurality of electrodes (13) are brought into contact with the plurality of lead terminals (3) to inspect an electrical characteristic of the optical semiconductor device (1).
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title INSPECTION DEVICE FOR OPTICAL SEMICONDUCTOR DEVICE
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