CONTROLLER FOR A MICROTOME, MICROTOME SYSTEM AND CORRESPONDING METHOD

CONTROLLER FOR A MICROTOME, MICROTOME SYSTEM AND CORRESPONDING METHOD

A controller for a microtome configured to cut slices from a sample block is configured to control a display to visualize a virtual representation of the sample block, receive first user input data indicative of a front surface of the sample block, determine a virtual front surface of the sample blo...

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Hauptverfasser: HECHT, Frank, KATZENGRUBER, Matthias, WURZINGER, Paul
Format: Patent
Sprache:eng
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator HECHT, Frank
KATZENGRUBER, Matthias
WURZINGER, Paul
description A controller for a microtome configured to cut slices from a sample block is configured to control a display to visualize a virtual representation of the sample block, receive first user input data indicative of a front surface of the sample block, determine a virtual front surface of the sample block based on the first user input data, receive second user input data indicative of an edge of the front surface of the sample block, determine a virtual edge of the front surface of the sample block based on the second user input data, receive third user input data indicative of a cutting plane intersecting the sample block, determine a virtual cutting plane intersecting the sample block based on the third user input, and determine alignment parameters based on the virtual front surface and the virtual edge of the front surface of the sample block and the virtual cutting plane.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title CONTROLLER FOR A MICROTOME, MICROTOME SYSTEM AND CORRESPONDING METHOD
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