APPARATUS AND METHOD FOR DETECTING DEFECT USING DEEP LEARNING-BASED SURFACE INSPECTION

An apparatus for detecting defects using deep learning-based surface inspection, includes: a normal image-based unsupervised training unit configured to, based on a normal image, train a reconstructive sub-network which allows an original image to be obtained through an image with noise inserted, an...

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Bibliographische Detailangaben
Hauptverfasser: KIM, Donghyun, LEE, Seungho, LEE, Changhong, LEE, Jaemin, KIM, Jongdeok
Format: Patent
Sprache:eng
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Zusammenfassung:An apparatus for detecting defects using deep learning-based surface inspection, includes: a normal image-based unsupervised training unit configured to, based on a normal image, train a reconstructive sub-network which allows an original image to be obtained through an image with noise inserted, and a discriminative sub-network which allows detection of a noise area; and a defective image-based online supervised training unit configured to, based on a defective image, train a reconstructive sub-network which inputs an inspection target image to generate a flaw removal image, and a discriminative sub-network which extracts a flaw area image by comparing a difference between the inspection target image and the flaw removal image.