SPECTRUM ANALYSIS SYSTEM AND SPECTRUM ANALYSIS METHOD

SPECTRUM ANALYSIS SYSTEM AND SPECTRUM ANALYSIS METHOD

This spectrum analysis system has a measurer, a display, and a controller that displays plurality of first anomaly items that indicate the type of anomaly in appearance of the measurement spectrum waveform. The controller displays the first reference spectrum waveform for reference to a mode of appe...

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Hauptverfasser: FUJI, Risa, MURAKAMI, Sachio, IWASAKI, Shoko
Format: Patent
Sprache:eng
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator FUJI, Risa
MURAKAMI, Sachio
IWASAKI, Shoko
description This spectrum analysis system has a measurer, a display, and a controller that displays plurality of first anomaly items that indicate the type of anomaly in appearance of the measurement spectrum waveform. The controller displays the first reference spectrum waveform for reference to a mode of appearance of the anomaly corresponding to each of the plurality of first anomaly items in the display.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SPECTRUM ANALYSIS SYSTEM AND SPECTRUM ANALYSIS METHOD
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