Device and Method for Predicting Low Voltage Failure of Secondary Battery, and Battery Control System Comprising Same Device

Device and Method for Predicting Low Voltage Failure of Secondary Battery, and Battery Control System Comprising Same Device

The present invention relates to an apparatus and a method of predicting a low-voltage failure of a secondary battery.

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Lee, Kyu Hwang, Kong, Changsun, Kim, Sunmin
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Lee, Kyu Hwang
Kong, Changsun
Kim, Sunmin
description The present invention relates to an apparatus and a method of predicting a low-voltage failure of a secondary battery.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_US2024168093A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>US2024168093A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_US2024168093A13</originalsourceid><addsrcrecordid>eNqNjcsKwjAQRbtxIeo_DLhV6ENEl1otLhSEqNsSkmkNpJmSjkrBj_fVD3B1OXA5px88N3g3CkE6DQfkK2koyMPRozaKjSthTw-4kGVZImTS2JtHoAIEKnJa-hbWkhl9O_k6OoCUHHuyINqGsXpjVXvTfHxCVgi_6jDoFdI2OOp2EIyz7SndTbGmHJtaKnTI-VnEYTyL5otwmayi5L_XCzVUR2Y</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>Device and Method for Predicting Low Voltage Failure of Secondary Battery, and Battery Control System Comprising Same Device</title><source>esp@cenet</source><creator>Lee, Kyu Hwang ; Kong, Changsun ; Kim, Sunmin</creator><creatorcontrib>Lee, Kyu Hwang ; Kong, Changsun ; Kim, Sunmin</creatorcontrib><description>The present invention relates to an apparatus and a method of predicting a low-voltage failure of a secondary battery.</description><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240523&amp;DB=EPODOC&amp;CC=US&amp;NR=2024168093A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,777,882,25545,76296</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240523&amp;DB=EPODOC&amp;CC=US&amp;NR=2024168093A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Lee, Kyu Hwang</creatorcontrib><creatorcontrib>Kong, Changsun</creatorcontrib><creatorcontrib>Kim, Sunmin</creatorcontrib><title>Device and Method for Predicting Low Voltage Failure of Secondary Battery, and Battery Control System Comprising Same Device</title><description>The present invention relates to an apparatus and a method of predicting a low-voltage failure of a secondary battery.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjcsKwjAQRbtxIeo_DLhV6ENEl1otLhSEqNsSkmkNpJmSjkrBj_fVD3B1OXA5px88N3g3CkE6DQfkK2koyMPRozaKjSthTw-4kGVZImTS2JtHoAIEKnJa-hbWkhl9O_k6OoCUHHuyINqGsXpjVXvTfHxCVgi_6jDoFdI2OOp2EIyz7SndTbGmHJtaKnTI-VnEYTyL5otwmayi5L_XCzVUR2Y</recordid><startdate>20240523</startdate><enddate>20240523</enddate><creator>Lee, Kyu Hwang</creator><creator>Kong, Changsun</creator><creator>Kim, Sunmin</creator><scope>EVB</scope></search><sort><creationdate>20240523</creationdate><title>Device and Method for Predicting Low Voltage Failure of Secondary Battery, and Battery Control System Comprising Same Device</title><author>Lee, Kyu Hwang ; Kong, Changsun ; Kim, Sunmin</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_US2024168093A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Lee, Kyu Hwang</creatorcontrib><creatorcontrib>Kong, Changsun</creatorcontrib><creatorcontrib>Kim, Sunmin</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Lee, Kyu Hwang</au><au>Kong, Changsun</au><au>Kim, Sunmin</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Device and Method for Predicting Low Voltage Failure of Secondary Battery, and Battery Control System Comprising Same Device</title><date>2024-05-23</date><risdate>2024</risdate><abstract>The present invention relates to an apparatus and a method of predicting a low-voltage failure of a secondary battery.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng
recordid cdi_epo_espacenet_US2024168093A1
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title Device and Method for Predicting Low Voltage Failure of Secondary Battery, and Battery Control System Comprising Same Device
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T21%3A46%3A06IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Lee,%20Kyu%20Hwang&rft.date=2024-05-23&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EUS2024168093A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true