BILAYER SEAL MATERIAL FOR AIR GAPS IN SEMICONDUCTOR DEVICES

The present disclosure relates to a method for forming a semiconductor device includes forming an opening between first and second sidewalls of respective first and second terminals. The first and second sidewalls oppose each other. The method further includes depositing a first dielectric material...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: LIANG, Shuen-Shin, UENO, Tetsuji, CHEN, Ting-Ting, LIN, Keng-Chu, WANG, Chen-Han
Format: Patent
Sprache:eng
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!