METHOD FOR PREDICTING A REMAINING FAILURE OR LIFETIME OF AN ELECTRICAL COMPONENT OF AN ELECTRICAL CIRCUIT

The present invention provides a method for predicting a remaining lifetime of an electrical component of an electrical circuit, the electrical circuit being part of a building management device. The method comprises: estimating (S1) two or more estimated temperatures of the electrical component by...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Carracedo Cordovilla, Luis Javier, Klein, Tobias, Zengerle, Thomas, Hüttinger, Ulrich, Schmölzer, Andreas, Mayrhofer, Markus
Format:	Patent
Sprache:	eng
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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